PM8621 datasheet(167/184 Pages) PMC

167 / 184 page

NSE-8G™ Standard Product Data Sheet

Preliminary

Proprietary and Confidential to PMC-Sierra, Inc., and for its Customers’ Internal Use

166

Document ID: PMC-2010850, Issue 1

Boundary Scan Instructions

The following is a description of the standard instructions. Each instruction selects a serial test

data register path between input, TDI and output, TDO.

12.14.3 Instructions

BYPASS

The bypass instruction shifts data from input, TDI to output, TDO with one TCK clock period

delay. The instruction is used to bypass the device.

EXTEST

The external test instruction allows testing of the interconnection to other devices. When the

current instruction is the EXTEST instruction, the boundary scan register is place between input,

TDI and output, TDO. Primary device inputs can be sampled by loading the boundary scan

boundary scan register using the Shift-DR state. Primary device outputs can be controlled by

loading patterns shifted in through input TDI into the boundary scan register using the

Update-DR state.

SAMPLE

The sample instruction samples all the device inputs and outputs. For this instruction, the

boundary scan register is placed between TDI and TDO. Primary device inputs and outputs can

be sampled by loading the boundary scan register using the Capture-DR state. The sampled

values can then be viewed by shifting the boundary scan register using the Shift-DR state.

IDCODE

The identification instruction is used to connect the identification register between TDI and TDO.

The device's identification code can then be shifted out using the Shift-DR state.

STCTEST

The single transport chain instruction is used to test out the TAP controller and the boundary scan

identification code is loaded into the boundary scan register. The code can then be shifted out

output, TDO using the Shift-DR state.

PM8621 Datasheet(PDF) 167 Page - PMC-Sierra, Inc