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MAC7200 Datasheet(PDF) 964 Page - Freescale Semiconductor, Inc

Part # MAC7200
Description  MAC7200 Microcontroller Family Reference Manual
PDF  976 Pages
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Manufacturer  FREESCALE [Freescale Semiconductor, Inc]
Direct Link  http://www.freescale.com
Logo FREESCALE - Freescale Semiconductor, Inc

MAC7200 Datasheet(HTML) 964 Page - Freescale Semiconductor, Inc

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Analog-to-Digital Converter Characteristics
MAC7200 Microcontroller Family Reference Manual, Rev. 2
886
Freescale Semiconductor
For the following definitions see also Figure A-13.
DNL — Differential Non Linearity Error
The measured device output codes are normalized, and the difference of each code width from 1 LSB is
measured. The largest difference is reported as the DNL.
Eqn. A-14
where
•
x = location in the normalized results array where a voltage ramp begins
•
y = location in the normalized results array where a voltage ramp ends
•
ViStart = the input voltage when the observed normalized output changes
•
ViEnd = the input voltage when the normalized output changed previously
•
Bitweight = volts per LSB step
INL — Integral (Cumulative) Non Linearity Error
The measured output codes are normalized and compared against the codes that would be produced by an
ideal ATD. The difference is taken between each measured transition point and the corresponding
transition point for the ideal ATD. The largest difference is reported as INL.
Eqn. A-15
X3
P Integral Nonlinearity @12MHz ATD clock and
12-bit resolution
INL
-8
—
+8
Counts
X4
P Total unadjusted Error2 @12MHz ATD clock and
12-bit resolution3:
VRL + 100mV <= Vin <= VRH - 100mV
TUE
-8
—
+8
Counts
0 <= Vin < VRL + 100mV
and
VRH -100mV <= Vin <VRH
-16
—
+16
X5
C Source Impedance4
RSource
0
—
100
kohm
1. At VRH - VRL = 5.12V, one LSB = 1.25mV = one count
2. These values include the quantization error which is inherently 1/2 count for any A/D converter.
3. The TUE specification will always be better than the sum of the INL and DNL errors due to cancelling errors.
4. If using a source impedance greater than 150 ohm, then the customer should characterize the ATD sample clock
value.
Table A-31. ATD Conversion Performance in 5 V Range (Continued)
Conditions shown in Table A-5 unless otherwise noted.
VREF = VRH – VRL = 5.12 V, resulting in one 9 bit count = 10 mV and one 12 bit count = 1.25 mV
fATDCLK = 12 MHz, VDDA -0.1V ≤ VRH ≤ VDDA + 0.1V, with calibration, a source impedance of < 150 ohm, no
precondition, WARP on.
y
i = x
MAX[ABS(ViStart - ViEnd) - Bitweight]
y
i = x
MAX[(ViActual - ViIdeal)]



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