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AT94K Datasheet(PDF) 71 Page - ATMEL Corporation |
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AT94K Datasheet(HTML) 71 Page - ATMEL Corporation |
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71 / 192 page ![]() 71 AT94K Series FPSLIC Rev. 1138F–FPSLI–06/02 Assuming Run-Test/Idle is the present state, a typical scenario for using the JTAG interface is • At the TMS input, apply the sequence 1, 1, 0, 0 at the rising edges of TCK to enter the Shift Instruction Register - Shift-IR state. While TMS is Low, shift the 4 bit JTAG instructions into the JTAG instruction register from the TDI input at the rising edge of TCK, while the captured IR-state 0x01 is shifts out on the TDO pin. The JTAG Instruction selects a particular Data Register as path between TDI and TDO and controls the circuitry surrounding the selected Data Register. • Apply the TMS sequence 1, 1, 0 to re-enter the Run-Test/Idle state. The instruction is latched onto the parallel output from the shift register path in the Update-IR state. The Exit-IR, Pause-IR, and Exit2-IR states are only used for navigating the state machine. • At the TMS input, apply the sequence 1, 0, 0 at the rising edges of TCK to enter the Shift Data Register - Shift-DR state. While TMS is Low, upload the selected Data Register (selected by the present JTAG instruction in the JTAG Instruction Register) from the TDI input at the rising edge of TCK. At the same time, the parallel inputs to the Data Register captured in the Capture-DR state shifts out on the TDO pin. • Apply the TMS sequence 1, 1, 0 to re-enter the Run-Test/Idle state. If the selected Data Register has a latched parallel-output, the latching takes place in the Update-DR state. The Exit-DR, Pause-DR, and Exit2-DR states are only used for navigating the state machine. As shown in Figure 40 on page 70, the Run-Test/Idle (1) state need not be entered between selecting JTAG instruction and using Data Registers, and some JTAG instructions may select certain functions to be performed in the Run-Test/Idle, making it unsuitable as an Idle state. Note: 1. Independent of the initial state of the TAP Controller, the Test-Logic-Reset state can always be entered by holding TMS High for 5 TCK clock periods. Using the Boundary-scan Chain A complete description of the Boundary-Scan capabilities are given in the section “IEEE 1149.1 (JTAG) Boundary-scan” on page 73. Using the On-chip Debug System As shown in Figure 39, the hardware support for On-Chip Debugging consists mainly of • A scan chain on the interface between the internal AVR CPU and the internal peripheral units • A breakpoint unit • A communication interface between the CPU and JTAG system • A scan chain on the interface between the internal AVR CPU and the FPGA • A scan chain on the interface between the internal Program/Data SRAM and the FPGA All read or modify/write operations needed for implementing the Debugger are done by apply- ing AVR instructions via the internal AVR CPU Scan Chain. The CPU sends the result to an I/O memory mapped location which is part of the communication interface between the CPU and the JTAG system. |
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