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ATXP032 Datasheet(PDF) 103 Page - Dialog Semiconductor |
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ATXP032 Datasheet(HTML) 103 Page - Dialog Semiconductor |
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103 / 113 page ![]() 101 ATXP032 DS-ATXP032–114I–4-2020 Figure 14-2. Overshoot / Undershoot Definition 14.10 Input Test Waveforms and Measurement Levels 14.11 Output Test Load 15. Power-On / Reset State When power is first applied to the device, or when recovering from a reset condition, the output pin (SO) is in a high impedance state, and a high-to-low transition on the CS pin is required to start a valid instruction. The SPI mode (3 or 0) is automatically selected on every falling edge of CS by sampling the inactive clock state. 15.1 Power-Up/Power-Down Voltage and Timing Requirements As the device initializes, there is a transient current demand. The system needs to be capable of providing this current to ensure correct initialization. During power-up, the device must not be READ for at least the minimum t VCSL time after the supply voltage reaches the minimum VCC level (VCC min). While the device is being powered- up, the internal Power-on Reset (POR) circuitry keeps the device in a reset mode until the supply voltage rises above the minimum V CC. During this time, all operations are disabled and the device does not respond to any commands. The internal reset level, V POR, is lower than VCC min. However, the tVCSL time is measured from when V CC reaches VCC min. If the first operation to the device after power-up is a program or erase operation, then the operation cannot be started until the supply voltage reaches the minimum V CC level and an internal device delay has elapsed. This delay is a maximum time of t PUW. After the tPUW time, the device is placed in standby mode if CS is at logic high or active mode if CS is at logic low. For the case of power-down then power-up operation, or if a power interruption V CC GND Voltage Time Undershoot Area Overshoot Area Maximum Amplitude Maximum Amplitude AC DRIVING LEVELS AC MEASUREMENT LEVEL 0.1V CC V CC/2 0.9V CC tR, tF < 2 ns (10% to 90%) Device Under Test C L |
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