SC28L202 datasheet(64/77 Pages) PHILIPS

64 / 77 page

Philips Semiconductors

Objective specification

SC28L202

Dual UART

2000 Feb 10

NOTES:

1. Parameters are valid over specified temperature range.

2. All voltage measurements are referenced to ground (GND). For testing, all inputs swing between 0.4V and 3.0V with a transition time of 5 ns

maximum. For X1/CLK this swing is between 0.4V and 4.4V. All time measurements are referenced at input voltages of 0.8V and 2.0V and

output voltages of 0.8V and 2.0V, as appropriate.

3. Test conditions for outputs: CL = 150 pF, except interrupt outputs. Test conditions for interrupt outputs: CL = 50 pF, RL = 2.7K ohm to VCC.

4. Typical values are at +25

_C, typical supply voltages, and typical processing parameters.

5. Timing is illustrated and referenced to the WRN and RDN inputs. Also, CEN may be the ‘strobing’ input. CEN and RDN (also CEN and

WRN) are ORed internally. The signal asserted last initiates the cycle and the signal negated first terminates the cycle.

6. Guaranteed by characterization of sample units.

7. If CEN is used as the ‘strobing’ input, the parameter defines the minimum High times between one CEN and the next. The RDN signal must

be negated for t RWD time to guarantee that any status register changes are valid.

8. Minimum frequencies are not tested but are guaranteed by design.

9. Clocks for 1X mode should be symmetrical.

SC28L202 Datasheet(PDF) 64 Page - NXP Semiconductors