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M58WT032KB Datasheet(PDF) 56 Page - Numonyx B.V |
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M58WT032KB Datasheet(HTML) 56 Page - Numonyx B.V |
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56 / 117 page ![]() Program and erase times and endurance cycles M58WTxxxKT, M58WTxxxKB 56/117 12 Program and erase times and endurance cycles The program and erase times and the number of program/ erase cycles per block are shown in Table 17. Exact erase times may change depending on the memory array condition. The best case is when all the bits in the block or bank are at ‘0’ (preprogrammed). The worst case is when all the bits in the block or bank are at ‘1’ (not preprogrammed). Usually, the system overhead is negligible with respect to the erase time. In the M58WTxxxKT/B the maximum number of program/ erase cycles depends on the VPP voltage supply used. Table 17. Program/erase times and endurance cycles(1) Parameter Condition Min Typ Typical after 100 k W/E cycles Max Unit Erase Parameter block (4 Kword)(2) 0.3 1 2.5 s Main block (32 Kword) Preprogrammed 0.8 3 4 s Not preprogrammed 1 4 s Program(3) Word 12 12 100 µs Parameter block (4 Kword) 40 ms Main block (32 Kword) 300 ms Suspend latency Program 5 10 µs Erase 5 20 µs Program/Erase Cycles (per Block) Main blocks 100 000 cycles Parameter blocks 100 000 cycles Erase Parameter block (4 Kword) 0.25 2.5 s Main block (32 Kword) 0.8 4 s Program(3) Word/ double word/ quadruple word(4) 10 100 µs Parameter block (4 Kword) Quad-enhanced factory 11 ms Enhanced factory 45 ms Quadruple word(4) 10 ms Word 40 ms Main block ( 32 Kword) Quad-enhanced factory 94 ms Enhanced factory 360 ms Quadruple word(4) 80 ms Word 328 ms Bank (4 Mbit) Quad-enhanced factory(4) 0.75 s Quadruple word(4) 0.65 s Program/erase cycles (per block) Main blocks 1000 cycles Parameter blocks 2500 cycles 1. TA = –40 to 85 °C; VDD = VDDQ = 1.7 V to 2 V; VDDQ = 2.7 V to 3.3 V. 2. The difference between preprogrammed and not preprogrammed is not significant (< 30 ms). 3. Values are liable to change with the external system-level overhead (command sequence and Status Register polling execution). 4. Measurements performed at 25°C. TA = 30 °C ±10 °C for quadruple word, double word and quadruple enhanced factory program. |
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