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MAC7200 Datasheet(PDF) 853 Page - Freescale Semiconductor, Inc

Part # MAC7200
Description  MAC7200 Microcontroller Family Reference Manual
PDF  976 Pages
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Manufacturer  FREESCALE [Freescale Semiconductor, Inc]
Direct Link  http://www.freescale.com
Logo FREESCALE - Freescale Semiconductor, Inc

MAC7200 Datasheet(HTML) 853 Page - Freescale Semiconductor, Inc

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Initialization/Application Information
MAC7200 Microcontroller Family Reference Manual, Rev. 2
Freescale Semiconductor
775
7. Start conversions:
— Either program the DMA to write command words to ATDCW or
— manually write the command word sequence to ATDCW using ATDFLAG.CQNF as an
indicator for more command words needed
8. Get conversion results:
— Either program the DMA to read results from ATDRR or
— manually read the result sequence from ATDRR using ATDFLAG.CC as an indicator for the
end of a conversion
Please refer to 12.2, “The SPP DMA Controller Module (SPP_DMA2)” for further details about how to
use the DMA.
33.12.2 ATD Calibration / Result Adjustment
An ideal ATD transfer curve put into a coordinate system is linear, starting in the origin (no offset). It
reaches its maximum value 0xFFF (for 12-bit right justified conversions) at (VRH-VRL). The real device
behavior will differ slightly. Environment factors during chip production or chip operation (e.g.
temperature, voltage etc.) can have an influence.
As the ATD transfer curve is very linear the only two transfer curve factors that will vary are the slope
(gain) and the origin (offset). The ATD has the possibility to do a numerical adjustment of the transfer
curve: the gain and / or the offset of the raw conversion result can be adjusted by doing a multiply-and-add
operation via the MADD unit. This feature can be enabled/disabled on a command word level by setting
the ATDCW.CWAR bit. The adjustment of the raw conversion result is called a “result adjustment.”
This adjustment requires two factors: gain (GCC) and offset (OCC). The determination of these two
factors is called “calibration.” A calibration must be done each time when the chip operation factors are
changing in a way which that it affects the ATD accuracy. The calibration must not be done before each
conversion.
NOTE
Changing the gain and offset has no influence to the analog behavior.
In addition to the MADD unit, the warp-feature is available. This will influence the analog behavior of the
ATD. By setting this bit the gain is decreased by a fixed value to avoid that the maximum conversion result
of 0xFFF is already reached before VRH-VRL is reached (see Figure 33-23). Enabling the Warp-feature
will usually overcompensate an existing gain error and increase the offset. Therefore it is required to adjust
the GCC and OCC factors after warp has been enabled. How this is done is explained in Section 33.12.2.3,
“Steps Required For Calibration”. Refer to Section 33.10.2.4, “ATD Operating Modes Register
(ATDMODE),” for details about how to enable this feature.



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