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MAC7200 Datasheet(PDF) 857 Page - Freescale Semiconductor, Inc |
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MAC7200 Datasheet(HTML) 857 Page - Freescale Semiconductor, Inc |
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857 / 976 page ![]() Initialization/Application Information MAC7200 Microcontroller Family Reference Manual, Rev. 2 Freescale Semiconductor 779 Figure 33-26. Offset Error Compensated via OCC 33.12.2.3 Steps Required For Calibration To reduce the total unadjusted error of the conversion results the ATD provides a multiply-and-add mechanism (MADD) which will adjust the raw conversion result. This adjustment requires two factors: Gain Calibration Constant (GCC) and Offset Calibration Constant (OCC). The determination of these two factors is called “calibration.” To determine the two factors the following must be done: 1. Execute initialization steps 1 to 4. (see Section 33.12.1, “Initialization”) 2. Sample special channel 75% x (VRH -VRL) multiple times 3. Sample special channel 25% x (VRH -VRL) multiple times 4. Determine gain calibration constant GCC from Gain 5. Determine offset calibration constant OCC from Offset 6. Write GCC and OCC to ATDCAL This sequence is described in details in the following sections. The calibration must always be repeated when influence factors for the ATD accurracy change. As the ATD supply voltages are not expected to drift the most important influence factor is the temperature. Although the ATD is very temperature resistant in high accurracy applications a drift might get visible. The temperature usually changes rapidly when the device is turned on and the ambient temperature is very low. During this time the gain and the offset are expected to change. But once the device heated up the gain and offset should remain constant. VRH-VRL VANx Counts 0x3FF VRH-VRL Ideal transfer curve 0x000 TUE [counts] VANx 0xF Adjusted via OCC Offset > 0 Offset < 0 |
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