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SC4000 Datasheet(PDF) 35 Page - NXP Semiconductors

Part # SC4000
Description  Universal Timeslot Interchange
PDF  52 Pages
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Manufacturer  PHILIPS [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

SC4000 Datasheet(HTML) 35 Page - NXP Semiconductors

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2000 Sep 07
35
Philips Semiconductors
Preliminary specification
Universal Timeslot Interchange
SC4000
4. Read Command/Status register and
test for NOT BUSY. (Note2)
5. Read contents of Low Byte Data regis-
ter and High Byte Data register as
required.
Note 1:It is not necessary to test for
NOT BUSY in this step if the protocol
used to access the SC4000 does not allow
the previous command to be completed
until the Command/Status register indi-
cates NOT BUSY.
Note 2:It is not necessary to test for
NOT BUSY in this step if the Command
given does not require synchronization
or if the protocol used to access the
SC4000 allows a command to be com-
pleted while the Command/Status regis-
ter indicates BUSY.
Note 3:It is not necessary to execute this
step if the Command given does not re-
quire synchronization.
Note 4:The Channel Bank Select field
may be changed during the same write
cycle which issues a command. The
command will effect the register pointed
to by the new value in the Channel Bank
Select Field.
Test
The Nand gate test chain is enabled by
forcing the TEST pin “high”. When in
test mode each pin is “nanded” with the
preceding pin and output at the end of
chain.
X_IN
D_0
REF_8K_0
D_1
REF_8K_1
D_2
REF_8K_2
D_3
REF_8K_3
D_4
TXD_0
D_5
RXD
D_6
MC_CLK
D_7
I_N
SCLKX2N
INT_0
SCLKX2NA
INT_1
SCLK
CS_0_N
SCLKA
CS_1_N
SREF_8K
RD_N
SREF_8KA
WR_N
FSYNCN
DACK_N
FSYNCNA
ALE
CLKFAIL
A_0
CLKFAILA
A_1
SD_0
A_2
SD_1
A_3
SD_2
A_4
SD_3
A_5
SD_4
A_6
SD_5
A_7
SD_6
A_8
SD_7
↓
SD_8
DRQ_R
SD_9
SD_10
SD_11
SD_12
SD_13
SD_14
SD_15
MC
MCA
L_CLK
L_FS
SO_0
SO_1
SO_2
SO_3
SI_0
SI_1
SI_2
SI_3
RESET
↓
DRQ_T



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