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ADS4449 Datasheet(PDF) 40 Page - Texas Instruments |
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ADS4449 Datasheet(HTML) 40 Page - Texas Instruments |
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40 / 54 page ![]() ADS4449 SBAS603 – APRIL 2013 www.ti.com APPLICATION INFORMATION THEORY OF OPERATION The ADS4449 is a quad-channel, 14-bit, analog-to-digital converter (ADC) with sampling rates up to 250 MSPS. At every falling edge of the input clock, the analog input signal for each channel is sampled simultaneously. The sampled signal in each channel is converted by a pipeline of low-resolution stages. In each stage, the sampled-and-held signal is converted by a high-speed, low-resolution, flash sub-ADC. The difference (residue) between the stage input and quantized equivalent is gained and propagates to the next stage. At every clock, each subsequent stage resolves the sampled input with greater accuracy. The digital outputs from all stages are combined in a digital correction logic block and are digitally processed to create the final code, after a data latency of 10 clock cycles. The digital output is available in a double data rate (DDR) low-voltage differential signaling (LVDS) interface and is coded in binary twos complement format. ENABLING 14-BIT RESOLUTION By default after reset, the ADS4449 outputs 11-bit data on the Dxx13P, Dxx13M and Dxx3P, Dxx3M pins and OVR information on the Dxx0P, Dxx0M pins. When the ALWAYS WRITE 1 bits are set, the ADC outputs 13-bit data on the Dxx13P, Dxx13M and Dxx1P, Dxx1M pins and OVR information on the Dxx0P, Dxx0M pins. To enable 14-bit resolution, the DIS OVR ON LSB register bit must be set to '1' as indicated in Table 6. Table 6. ADC configuration DATA ON ADC PINS ALWAYS WRITE 1 = 1 ADC PIN NAMES AFTER RESET ALWAYS WRITE 1 = 1 DIS OVR ON LSB = 1 Dxx13 D13 D13 D13 — — — — Dxx3 D3 D3 D3 Dxx2 Logic 0 D2 D2 Dxx1 Logic 1 D1 D1 Dxx0 OVR OVR D0 11-bit data (D[13:3]) and OVR come 13-bit data (D[13:1]) and OVR come 14-bit data comes on ADC output Comments on ADC output pins on ADC output pins pins ANALOG INPUT The analog input consists of a switched-capacitor-based differential sample-and-hold architecture. This differential topology results in very good ac performance even for high input frequencies at high sampling rates. The INP and INM pins must be externally biased around a common-mode voltage of 1.15 V, available on the VCM pin. For a full-scale differential input, each input pin (INP, INM) must swing symmetrically between VCM + 0.5 V and VCM – 0.5 V, resulting in a 2-VPP differential input swing. The input sampling circuit has a high 3-dB bandwidth that extends up to 500 MHz when a 50- Ω source drives the ADC analog inputs. Drive Circuit Requirements For optimum performance, the analog inputs must be driven differentially. This configuration improves the common-mode noise immunity and even-order harmonic rejection. A 5- Ω to 15-Ω resistor in series with each input pin is recommended to damp out ringing caused by package parasitics. Spurious-free dynamic range (SFDR) performance can be limited because of several reasons (such as the effect of sampling glitches, sampling circuit nonlinearity, and quantizer nonlinearity that follows the sampling circuit). Depending on the input frequency, sampling rate, and input amplitude, one of these metrics plays a dominant part in limiting performance. At very high input frequencies, SFDR is determined largely by the device sampling circuit nonlinearity. At low input amplitudes, the quantizer nonlinearity typically limits performance. 40 Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: ADS4449 |
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