PC87427 datasheet(25/46 Pages) NSC

25 / 46 page

2.0 Device Characteristics (Continued)

Revision 1.0

www.national.com

2.3

INTERNAL RESISTORS

DC Test Conditions

Figure 1. Internal Resistor Test Conditions, TA =0 °Cto70 °C, VSUP = 3.3V

Figure 2. Internal Pull-Up Resistor for Straps, TA =0 °Cto70 °C, VSUP = 3.3V

Notes for Figures 1 and 2:

1. VSUP is VDD or VSB according to the pin power well.

1. The equivalent resistance of the pull-up resistor is calculated by RPU = (VSUP − VPIN) / IPU.

2. The equivalent resistance of the pull-down resistor is calculated by RPD = VPIN / IPD.

2.3.1

Pull-Up and Pull-Down Resistors

Symbol: PUnn, PDnn

Symbol

Parameter

Conditions1

1. TA = 0 °C to 70 °C, VSUP = 3.3V.

Min2

2. Not tested. Guaranteed by characterization.

Typical

Max2

Unit

RPU

Pull-up equivalent resistance

VPIN =0V

−30%

nn+30%

Ω

RPD

Pull-down equivalent resistance

VPIN =VSUP

−30%

nn+30%

Ω

VPIN = 0.17 VSUP

3. For strap pins only.

−50%

Ω

VPIN = 0.8 VSUP

−48%

Ω

Device

Under

Test

RPU

Pull-Up Resistor Test Circuit

Pull-Down Resistor Test Circuit

VSUP

IPU

VPIN

Device

Under

Test

RPD

VSUP

IPD

VPIN

VSUP

Device

Under

Test

RPU

VSUP

IPU

VPIN

VSUP

Device

Under

Test

RPU

VSUP

IPU

VPIN

µA

VPIN < VIL

VPIN > VIH

µA

10 K

Ω

PC87427 Datasheet(PDF) 25 Page - National Semiconductor (TI)

PC87427 Datasheet(HTML) 25 Page - National Semiconductor (TI)

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46

Datasheet Download

Link URL