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ADPD1081 Datasheet(PDF) 44 Page - Analog Devices |
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ADPD1081 Datasheet(HTML) 44 Page - Analog Devices |
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44 / 74 page ![]() ADPD1080/ADPD1081 Data Sheet Rev. C | Page 44 of 74 If this minimum value is above 0 LSB, the TIA is not saturated. However, take care, because even if the result is not 0 LSB, operating the device near saturation can quickly result in saturation if light conditions change. A safe operating region is typically at ¾ full scale and lower. Use Table 29 to determine how the input codes map to ADC levels on a per channel per pulse basis. These codes are not the same as in normal mode because the BPF and integrator are not unity-gain elements. Measuring PCB Parasitic Input Resistance During the process of mounting the ADPD1080/ADPD1081, undesired resistance can develop on the inputs through assembly errors or debris on the PCB. These resistances can form between the anode and cathode, or between the anode and some other supply or ground. In normal operation, the ambient rejection feature of the ADPD1080/ADPD1081 masks the primary effects of these resistances, making it difficult to detect them. However, even at 1 MΩ to 10 MΩ, such resistance can affect performance significantly through added noise or decreased dynamic range. TIA ADC mode can screen for these assembly issues. Measuring Shunt Resistance on the Photodiode A shunt resistor across the photodiode does not generally affect the output level of the device in operation because the effective impedance of the TIA is low, especially if the photodiode is held to 0 V in operation. However, such resistance can add noise to the system, degrading performance. The best way to detect photodiode leakage, also called photodiode shunt resistance, is to place the device in TIA ADC mode in the dark and vary the operation mode cathode voltage. Setting the cathode to 1.3 V places 0 V across the photodiode because the anode is always at 1.3 V while in operation. Setting the cathode to 1.8 V places 0.5 V across the photodiode. Using the register settings in Table 3 to control the cathode voltage, measure the TIA ADC value at both voltages. Next, divide the voltage difference of 0.5 V by the difference of the ADC result after converting it to a current. This result is the approximate shunt resistance. Values greater than 10 MΩ may be difficult to measure, but this method is useful in identifying gross failures. Measuring TIA Input Shunt Resistance A resistance to develop between the TIA input and another supply or ground on the PCB is an example of another problem that can occur. These resistances can force the TIA into saturation prematurely. This premature saturation, in turn, takes away dynamic range from the device in operation and adds a Johnson noise component to the input. To measure these resistances, place the device in TIA ADC mode in the dark and start by measuring the TIA ADC offset level with the photodiode inputs disconnected (Register 0x14, Bits[11:8] = 0 or Register 0x14, Bits[7:4] = 0). From this, subtract the value of TIA ADC mode with the darkened photodiode connected and convert the difference into a current. If the value is positive, and the ADC signal decreased, the resistance is to a voltage higher than 1.3 V, such as VDD. Current entering the TIA causes the output to drop. If the output difference is negative due to an increase of codes at the ADC, current is being pulled out of the TIA, and there is a shunt resistance to a lower potential than 1.3 V, such as ground. Table 29. Analog Specifications for TIA ADC Mode Parameter Test Conditions/Comments Typ Unit TIA ADC Saturation Levels Values expressed per channel, per sample 25 kΩ gain 38.32 µA 50 kΩ gain 19.16 µA 100 kΩ gain 9.58 µA 200 kΩ gain 4.79 µA TIA Linear Range 25 kΩ gain 42.8 µA 50 kΩ gain 21.4 µA 100 kΩ gain 10.7 µA 200 kΩ gain 5.4 µA TIA ADC Resolution Values expressed per channel, per sample; TIA feedback resistor 25 kΩ 2.92 nA/LSB 50 kΩ 1.5 nA/LSB 100 kΩ 0.73 nA/LSB 200 kΩ 0.37 nA/LSB Output Without Input Photocurrent ADC offset (Register 0x18 to Register 0x21) = 0x0 13,000 LSB |
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