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IMX95CEC Datasheet(PDF) 36 Page - NXP Semiconductors

Part # IMX95CEC
Description  i.MX 95 Applications Processors Data Sheet for Commercial Products
PDF  113 Pages
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Manufacturer  NXP [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo NXP - NXP Semiconductors

IMX95CEC Datasheet(HTML) 36 Page - NXP Semiconductors

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1. Output timing valid for maximum external load CL = 25 pF, which is assumed to be a 10-pF load at the end of a 50 Ω ,
unterminated, 5-inch microstrip trace on standard FR4 (3.3 pF/inch), (25-pF total with margin). For best signal integrity, the
series resistance of the transmission line can be equal to the selected RDSON of the I/O pad output driver.
2. Input timing assumes an input signal slew rate of 3 ns (20%/80%).
3. 50 MHz frequency is for the JTAG debug interface. For boundary scan, the maximum TCK frequency is 10 MHz.
4. TDC = target frequency of JTAG
5. VM = mid-point voltage
Following figure depicts the JTAG test clock imput timing.
JTAG_TCK
(Input)
VM
VM
VIH
VIL
SJ1
SJ2
SJ2
SJ3
SJ3
Figure 9. Test Clock Input Timing Diagram
Following figure depicts the JTAG boundary scan timing.
JTAG_TCK
(Input)
Data
Inputs
Data
Outputs
Data
Outputs
Data
Outputs
VIH
VIL
Input Data Valid
Output Data Valid
Output Data Valid
SJ4
SJ5
SJ6
SJ7
SJ6
Figure 10. Boundary system (JTAG) timing diagram
Following figure depicts the JTAG test access port.
JTAG_TCK
(Input)
JTAG_TDI
(Input)
JTAG_TDO
(Output)
JTAG_TDO
(Output)
VIH
VIL
Input Data Valid
Output Data Valid
JTAG_TMS
SJ8
SJ9
SJ10
SJ11
SJ14
Figure 11. Test Access Port Timing Diagram
NXP Semiconductors
IMX95CEC
i.MX 95 Applications Processors Data Sheet for Commercial Products
IMX95CEC
All information provided in this document is subject to legal disclaimers.
© 2024 NXP B.V. All rights reserved.
Preliminary Data Sheet
Rev. 2 — 11 November 2024
Preliminary - Subject to Change Without Notice
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