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UPD17015 Datasheet(PDF) 13 Page - NEC |
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UPD17015 Datasheet(HTML) 13 Page - NEC |
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13 / 120 page  13 µPD17015 1.4 NOTES ON USE OF THE CE PIN The CE pin has the test mode selecting function for testing the internal operation of the µPD17015 (IC test), besides the functions shown in Section 1.1. Applying a voltage exceeding VDD to the CE pin causes the µPD17015 to enter the test mode. When noise exceeding VDD comes in during normal operation, the device is switched to the test mode. For example, if the wiring from the CE pin is too long, noise may be induced on the wiring, causing this mode switching. When installing the wiring, lay the wiring in such a way that noise is suppressed as much as possible. If noise yet arises, use an external part to suppress it as shown below. • Connect a diode with low VF between the pin • Connect a capacitor between the pin and VDD. and VDD. VDD VDD CE Diode with low VF CE VDD VDD |
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