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FXLS93421 Datasheet(PDF) 35 Page - NXP Semiconductors |
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FXLS93421 Datasheet(HTML) 35 Page - NXP Semiconductors |
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35 / 254 page  NXP Semiconductors FXLS9xxxx Dual channel inertial sensor VBUS_I_L_min ≤ (VBUS_I – VSS) ≤ VBUS_I_H_min, TL ≤ TA ≤ TH, ΔT ≤ 25 °C/min, unless otherwise specified # Characteristic Symbol Min Typ Max Units Test notes Offset Monitor 10883 Update Rate OFFMONOSC — 0.5 — ms 7, 8 10905 Count Limit OFFMONCNTLIMIT — 4096 — 1 7, 8 10904 Counter Size OFFMONCNTSIZE — 8192 — 1 7, 8 10881 Signal Delay (Sinc Filter to Output Delay, excluding LPF) tSigDelay — — 128 µs 7, 8 Interpolation 20923 tSigChain = tSigChain00, tSigChain01 tINTERP_00, 01 — 1 — µs 7, 8 20922 tSigChain = tSigChain02 tINTERP_02 — 2 — µs 7, 8 20921 tSigChain = tSigChain03 tINTERP_03 — 4 — µs 7, 8 10877 Interpolation Latency tLAT_INTERP — tSigChainxx — s 7, 8 Table 39. Dynamic electrical characteristics - signal chain...continued 10.17 Dynamic electrical characteristics - analog self-test response time VBUS_I_L_min ≤ (VBUS_I – VSS) ≤ VBUS_I_H_min, TL ≤ TA ≤ TH, ΔT ≤ 25 °C/min, unless otherwise specified # Characteristic Symbol Min Typ Max Units Test notes Medium g, Lateral Self-test Response Time: Self-test Activation/Deactivation to 99 %/1 % gST 10878 Medium g Lateral, LPF = 800 Hz, 4-Pole tST_Resp_MedX_800_4 750 795 1020 µs 7, 8 44634 Medium g Lateral, LPF = 1500 Hz, 4-Pole tST_Resp_MedX_1500_4 395 415 725 µs 7, 8 Self-test Response Time: Self-test Activation/Deactivation to 99 % / 1 % gST 38147 Medium g Lateral, LPF = 400 Hz, 4-Pole tST_Resp_MedX_400_4 1510 1590 1810 µs 7, 8 38151 Medium g Lateral, LPF = 400 Hz, 3-Pole tST_Resp_MedX_400_3 1420 1490 1710 µs 7, 8 38150 Medium g Lateral, LPF = 180 Hz, 2-Pole tST_Resp_MedX_180_2 3030 3190 3470 µs 7, 8 Self-test Response Time: Self-test Activation/Deactivation to 99 % / 1 % gST 38149 Medium g Lateral, LPF = 300 Hz, 4-Pole tST_Resp_MedX_300_4 2010 2120 2360 µs 7, 8 Self-test Response Time: Self-test Activation/Deactivation to 99 % / 1 % gST 38148 Medium g Lateral, LPF = 188 Hz, 4-Pole tST_Resp_MedX_188_4 3210 3380 3680 µs 7, 8 High g, Lateral Self-test Response Time: Self-test Activation/Deactivation to 99 % / 1 % gST 38152 High g Lateral, LPF = 800 Hz, 4-Pole tST_Resp_HiX_800_4 750 795 892 µs 7, 8 44636 High g Lateral, LPF = 1500 Hz, 4-Pole tST_Resp_HiX_1500_4 395 415 490 µs 7, 8 Self-test Response Time: Self-test Activation/Deactivation to 99 % / 1 % gST 38153 High g Lateral, LPF = 400 Hz, 4-Pole tST_Resp_HiX_400_4 1510 1590 1720 µs 7, 8 38154 High g Lateral, LPF = 400 Hz, 3-Pole tST_Resp_HiX_400_3 1420 1490 1620 µs 7, 8 38155 High g Lateral, LPF = 180 Hz, 2-Pole tST_Resp_HiX_180_2 3030 3190 3400 µs 7, 8 Self-test Response Time: Self-test Activation/Deactivation to 99 % / 1 % gST 38156 High g Lateral, LPF = 300 Hz, 4-Pole tST_Resp_HiX_300_4 2010 2120 2280 µs 7, 8 Table 40. Dynamic electrical characteristics - analog self-test response time FXLS9xxxx All information provided in this document is subject to legal disclaimers. © NXP B.V. 2021. All rights reserved. Product data sheet Rev. 6 — 8 February 2021 35 / 254 |
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