LXT386LE datasheet(56/78 Pages) INTEL

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LXT386 — QUAD T1/E1/J1 Transceiver

Datasheet

Data decision threshold

SRE

Rel. to peak input voltage

Data slicer threshold

––

150

–

Loss of signal threshold

––

200

–

LOS hysteresis

––

–

Consecutive zeros before loss of signal

––

2048

––

G.775 recommendation

ETSI 300 233 specification

LOS reset

–

12.5%

––

–

1’s density

Low limit

input jitter

tolerance 1

1Hz to 20Hz

20Hz to 2.4kHz

18kHz to 100kHz

–

1.5

0.2

––

U.I.

G735 recommendation

Note 1

Cable Attenuation is 6 dB

Differential receiver input impedance

––

–

Ω

@1.024 MHz

Input termination resistor tolerance

–––

±1

Common mode input impedance to ground

––

–

Ω

Input return

loss1

51 kHz - 102 kHz

102 - 2048 kHz

2048kHz - 3072 kHz

–

Measured against nominal

impedance using

components in the LXD384

evaluation board.

LOS delay time

––

–

µs

Data recovery mode

LOS reset

–

255

marks

Data recovery mode

Receive intrinsic jitter, RCLK output

––

0.040

0.0625

U.I.

Wide band jitter

Receive

path delay

Bipolar mode

U.I.

JA Disabled

Unipolar mode

U.I.

Table 39. T1 Transmit Transmission Characteristics

Parameter

Sym

Min

Typ

Max

Unit

Test Condition

Output pulse amplitude

–

2.4

3.0

3.6

Measured at the DSX

Peak voltage of a space

–

-0.15

–

+0.15

Driver output impedance1

––

–

Ω

@ 772 KHz

Transmit amplitude variation with power

supply

–

-1

–

Ratio of positive to negative pulse amplitude

–

0.95

–

1.05

–

T1.102, isolated pulse

Difference between pulse sequences

––

–

200

For 17 consecutive

pulses, GR-499-CORE

Pulse width variation at half amplitude

––

–

Jitter added by

Transmitter1

10Hz - 8KHz

8KHz - 40KHz

10Hz - 40KHz

Wide Band

––

–

0.020

0.025

0.050

UIpk-pk

AT&T Pub 62411

TCLK is jitter free.

1. Guaranteed by design and other correlation methods.

2. Power measured in a 3 KHz bandwidth at the point the signal arrives at the distribution frame for an all 1’s pattern.

Table 38. E1 Receive Transmission Characteristics (Continued)

Parameter

Sym

Min

Typ

Max

Unit

Test Condition

1. Guaranteed by design and other correlation methods.

LXT386LE Datasheet(PDF) 56 Page - Intel Corporation

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