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OR3C80 Datasheet(PDF) 62 Page - Agere Systems |
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OR3C80 Datasheet(HTML) 62 Page - Agere Systems |
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62 / 210 page ![]() 62 62 Lucent Technologies Inc. Data Sheet June 1999 ORCA Series 3C and 3T FPGAs Special Function Blocks (continued) Boundary-Scan Cells Figure 40 is a diagram of the boundary-scan cell (BSC) in the ORCA series PICs. There are four BSCs in each PIC: one for each pad, except as noted above. The BSCs are connected serially to form the BSR. The BSC controls the functionality of the in, out, and 3-state signals for each pad. The BSC allows the I/O to function in either the normal or test mode. Normal mode is defined as when an out- put buffer receives input from the PLC array and pro- vides output at the pad or when an input buffer provides input from the pad to the PLC array. In the test mode, the BSC executes a boundary-scan operation, such as shifting in scan data from an upstream BSC in the BSR, providing test stimuli to the pad, capturing test data at the pad, etc. The primary functions of the BSC are shifting scan data serially in the BSR and observing input (p_in), output (p_out), and 3-state (p_ts) signals at the pads. The BSC consists of two circuits: the bidirectional data cell is used to access the input and output data, and the direction control cell is used to access the 3-state value. Both cells consist of a flip-flop used to shift scan data which feeds a flip-flop to control the I/O buffer. The bidirectional data cell is connected serially to the direc- tion control cell to form a boundary-scan shift register. The TAPC signals (capture, update, shiftn, treset, and TCK) and the MODE signal control the operation of the BSC. The bidirectional data cell is also controlled by the high out/low in (HOLI) signal generated by the direction control cell. When HOLI is low, the bidirec- tional data cell receives input buffer data into the BSC. When HOLI is high, the BSC is loaded with functional data from the PLC. The MODE signal is generated from the decode of the instruction register. When the MODE signal is high (EXTEST), the scan data is propagated to the output buffer. When the MODE signal is low (BYPASS or SAMPLE), functional data from the FPGA’s internal logic is propagated to the output buffer. The boundary-scan description language (BSDL) is provided for each device in the ORCA Series of FPGAs on the ORCA Foundry CD. The BSDL is generated from a device profile, pinout, and other boundary-scan information. 5-2844(F Figure 40. Boundary-Scan Cell D Q D Q D Q D Q SCAN IN p_out HOLI BIDIRECTIONAL DATA CELL I/O BUFFER DIRECTION CONTROL CELL MODE UPDATE/TCK SCAN OUT TCK SHIFTN/CAPTURE p_ts p_in PAD_IN PAD_TS PAD_OUT 0 1 0 1 0 1 0 1 0 1 |
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