AFE5807 datasheet(64/75 Pages) TI1

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FPGA Clock/

Noisy Clock

n×16×CW Freq

LMK048X

CDCE72010

CDCM7005

CDCLVP1208

LMK0030X

LMK01000

CDCLVP1208

LMK0030X

LMK01000

16X CW

CLK

1X CW

CLK

8 Synchronized

16 X CW CLKs

8 Synchronized

1X CW CLKs

B0436-01

AFE5807

SLOS703C – SEPTEMBER 2010 – REVISED MAY 2013

www.ti.com

Figure 90. CW Clock Distribution

CW Supporting Circuits

As a general practice in CW circuit design, in-phase and quadrature channels should be strictly symmetrical by

using well matched layout and high accuracy components.

In systems, additional high-pass wall filters (20Hz to 500Hz) and low-pass audio filters (10KHz to 100KHz) with

multiple poles are usually needed. Since CW Doppler signal ranges from 20Hz to 20KHz, noise under this range

is critical. Consequently low noise audio operational amplifiers are suitable to build these active filters for CW

post-processing, e.g. OPA1632 or OPA2211. More filter design techniques can be found from www.ti.com, e.g.

TI’s active filter design tool http://focus.ti.com/docs/toolsw/folders/print/filter-designer.html

The filtered audio CW I/Q signals are sampled by audio ADCs and processed by DSP or PC. Although CW

signal frequency is from 20 Hz to 20 KHz, higher sampling rate ADCs are still preferred for further decimation

and SNR enhancement. Due to the large dynamic range of CW signals, high resolution ADCs (>=16bit) are

required, such as ADS8413 (2MSPS/16it/92dBFS SNR) and ADS8472 (1MSPS/16bit/95dBFS SNR). ADCs for

in-phase and quadature-phase channels must be strictly matched, not only amplitude matching but also phase

matching, in order to achieve the best I/Q matching,. In addition, the in-phase and quadrature ADC channels

must be sampled simultaneously.

ADC OPERATION

ADC Clock Configurations

To ensure that the aperture delay and jitter are the same for all channels, the AFE5807 uses a clock tree

network to generate individual sampling clocks for each channel. The clock, for all the channels, are matched

from the source point to the sampling circuit of each of the eight internal ADCs. The variation on this delay is

described in the aperture delay parameter of the output interface timing. Its variation is given by the aperture jitter

number of the same table.

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