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AFE5807 Datasheet(PDF) 1 Page - Texas Instruments |
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AFE5807 Datasheet(HTML) 1 Page - Texas Instruments |
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1 / 75 page  AFE5807 www.ti.com SLOS703C – SEPTEMBER 2010 – REVISED MAY 2013 Fully Integrated, 8-Channel Ultrasound Analog Front End with Passive CW Mixer, 1.05 nV/rtHz, 12-Bit, 80 MSPS, 117 mW/CH Check for Samples: AFE5807 1 FEATURES DESCRIPTION The AFE5807 is an integrated Analog Front-End • 8-Channel Complete Analog Front-End (AFE) solution specifically designed for ultrasound – LNA, VCAT, PGA, LPF, ADC, and CW Mixer systems in which high performance and small size • Programmable Gain Low-Noise Amplifier are required. The AFE5807 integrates a complete (LNA) time-gain-control (TGC) imaging path and a continuous wave Doppler (CWD) path. It also enables – 24/18/12 dB Gain users to select one of various power/noise – 0.25/0.5/1 VPP Linear Input Range combinations to optimize system performance. – 0.63/0.7/0.9 nV/rtHz IRN (Low Noise Mode) Therefore, the AFE5807 is a suitable ultrasound analog front end solution not only for high-end – 0.99/1.0/1.05 nV/rtHz IRN (Low Power Mode) systems, but also for portable systems. – Programmable Active Termination The AFE5807 contains eight channels of voltage • 40 dB Low Noise Voltage Controlled controlled amplifier (VCA), 12-bit Analog-to-Digital Attenuator (VCAT) Converter (ADC), and CW mixer. The VCA includes • 24/30 dB Programmable Gain Amplifier (PGA) Low noise Amplifier (LNA), Voltage controlled • 3rd Order Linear Phase Low-Pass Filter (LPF) Attenuator(VCAT), Programmable Gain Amplifier (PGA), and Low-Pass Filter (LPF). The LNA gain is – 10, 15, 20, 30 MHz programmable to support 250 mVPP to 1 VPP input • 12-bit Analog to Digital Converter (ADC) signals. Programmable active termination is also – 70 dBFS SNR at 80 MSPS supported by the LNA. The ultra-low noise VCAT provides an attenuation control range of 40 dB and – LVDS Outputs improves overall low gain SNR which benefits • Noise/Power Optimizations (Full Chain) harmonic imaging and near field imaging. The PGA – 117 mW/CH at 1.05 nV/rtHz, 80 MSPS provides gain options of 24 dB and 30 dB. Before the ADC, a LPF can be configured as 10 MHz, 15 MHz, – 159 mW/CH at 0.75 nV/rtHz, 80 MSPS 20 MHz or 30 MHz to support ultrasound applications – 80 mW/CH at CW Mode with different frequencies. The high-performance 12 • Excellent Device-to-Device Gain Matching bit/80 MSPS ADC in the AFE5807 achieves 70 dBFS SNR. It ensures excellent SNR at low chain gain. The – ±0.5 dB(typical) and ±1 dB(max) ADC’s LVDS outputs enable flexible system • Low Harmonic Distortion integration desired for miniaturized systems. The • Fast and Consistent Overload Recovery AFE5807 also integrates a low power passive mixer • Passive Mixer for Continuous Wave and a low noise summing amplifier to accomplish on- chip CWD beamformer. 16 selectable phase-delays Doppler(CWD) can be applied to each analog input signal. – Low Close-in Phase Noise –156 dBc/Hz at 1 Meanwhile a unique 3rd and 5th order harmonic KHz off 2.5 MHz Carrier suppression filter is implemented to enhance CW – Phase Resolution of 1/16 λ sensitivity. – Support 16X, 8X, 4X and 1X CW Clocks The AFE5807 is available in a 15mm × 9mm, 135-pin – 12dB Suppression on 3rd and 5th Harmonics BGA package and it is specified for operation from 0°C to 85°C. It is also pin-to-pin compatible to the – Flexible Input Clocks AFE5808, AFE5803, and AFE5808A. In addtion, • Small Package: 15 mm x 9 mm, 135-BGA AFE5809 is another member with enhanced digital demodulation features in this family. APPLICATIONS • Medical Ultrasound Imaging • Nondestructive Evaluation Equipments 1 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PRODUCTION DATA information is current as of publication date. Copyright © 2010–2013, Texas Instruments Incorporated Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
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