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DAC38RF80 Datasheet(PDF) 52 Page - Texas Instruments

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Part # DAC38RF80
Description  Dual- or Single-Channel, Single-Ended or Differential Output, 14-Bit, 9-GSPS, RF-Sampling DAC With JESD204B Interface and On-Chip PLL
PDF  155 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

DAC38RF80 Datasheet(HTML) 52 Page - Texas Instruments

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52
DAC38RF80, DAC38RF83, DAC38RF84
DAC38RF85, DAC38RF90, DAC38RF93
SLASEA3C – DECEMBER 2016 – REVISED JULY 2017
www.ti.com
DAC38RF83 DAC38RF93
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Copyright © 2016–2017, Texas Instruments Incorporated
Several important controls related to SYSREF alignment and capture timing are contained in register
SYSR_CAPTURE (8.5.78). For example, as mentioned before, the device is capable of monitoring the observed
phases of the rising SYSREF edge events; however, in order to avoid unwanted noise coupling from the
SYSREF circuits into the DAC output, the SYSREF monitoring circuits are disabled by default. Field
SYSR_STATUS_ENA enables SYSREF status monitoring. Field SYSR_PHASE_WDW contains the the phase
tolerance
window
selected
for
normal
operation,
which
is
optimized
during
characterization.
Field
SYSR_ALIGN_DLY contains the control that allows the system designer to optionally offset the SYSREF
alignment event by ±1 device clock cycles. Field SYSR_STATUS_ENA enables the SYSREF capture alignment
accumulation and will generate alarms when enabled. Writing a “1” to field SYSR_ALIGN_SYNC clears the
accumulated SYSREF alignment statistics. The SYSREF alignment block can be bypassed completely by field
SYSREF_BYPASS_ALIGN, in which case SYSREF is latched by the rising edge of DACCLK.
When field SYSR_STATUS_ENA is high the device records the phase associated with each SYSREF event for
use in characterizing the SYSREF capture timing and selecting an appropriate phase tolerance window. The
phase data is available in two forms. First, each of the four phases has a corresponding “sticky” alarm flag
indicating which phases have been observed since the last time the register was cleared. In addition, the device
also accumulates statistics on the relative number of occurrences of each phase spanning multiple SYSREF
events using saturating 8-bit counters. These accumulated real-time SYSREF statistics allow us to account for
time-varying effects during characterization such as potential timing differences between the 1st and Nth edges
in a “gapped” SYSREF pulse train. The counters are fields PHASE1_CNT and PHASE2_CNT in register
SYSREF12_CNT (8.5.10), PHASE3_CNT and PHASE4_CNT in register SYSREF34_CNT (8.5.11), and
ALIGN_TO_R1_CNT and ALIGN_TO_R3_CNT in register SYSREF_ALIGN_R (8.5.9).
The accumulated SYSREF statistics can be cleared by writing ‘1’ to SYSR_ALIGN_SYNC. This sync signal
affects only the SYSREF statistics monitors and does not cause a sync of any other portions of the design.
Before collecting phase statistics, the user must first enable the SYSREF status monitoring logic by setting the
SYSR_STATUS_ENA
bit.
The
user
must
then
generate
a
repeating
SYSREF
input
before
using
SYSR_ALIGN_SYNC to clear the statistic counters. This is necessary to flush invalid data out of the status
pipeline.
The “sticky” alarm flags indicating which of the four phases have been observed since the last
SYSR_ALIGN_SYNC write of ‘1’ are fields ALM_SYSRPHASE1 to ALM_SYSRPHASE4 and are contained in the
ALM_SYSREF_DET register (8.5.6).
8.3.11 JESD204B Subclass 0 support
Some functionality has been implemented to support Subclass 0 operation. Note that programming the
SUBCLASSV configuration parameter has no functional impact on the logic. The value programmed for
SUBCLASSV is only used in the initial lane alignment (ILA) sequence. The following configuration parameters
are used to support Subclass 0 operation:
•
Field SYSREF_MODE in register JESD_SYSR_MODE (8.5.56) = 0
•
Field DISABLE_ERR_RPT in register JESD_ERR_OUT (8.5.53) = 1
•
Field MIN_LATENCY_ENA in register JESD_MATCH (8.5.50) = 1



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