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DAC38RF80 Datasheet(PDF) 52 Page - Texas Instruments |
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DAC38RF80 Datasheet(HTML) 52 Page - Texas Instruments |
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52 / 155 page ![]() 52 DAC38RF80, DAC38RF83, DAC38RF84 DAC38RF85, DAC38RF90, DAC38RF93 SLASEA3C – DECEMBER 2016 – REVISED JULY 2017 www.ti.com DAC38RF83 DAC38RF93 Submit Documentation Feedback Copyright © 2016–2017, Texas Instruments Incorporated Several important controls related to SYSREF alignment and capture timing are contained in register SYSR_CAPTURE (8.5.78). For example, as mentioned before, the device is capable of monitoring the observed phases of the rising SYSREF edge events; however, in order to avoid unwanted noise coupling from the SYSREF circuits into the DAC output, the SYSREF monitoring circuits are disabled by default. Field SYSR_STATUS_ENA enables SYSREF status monitoring. Field SYSR_PHASE_WDW contains the the phase tolerance window selected for normal operation, which is optimized during characterization. Field SYSR_ALIGN_DLY contains the control that allows the system designer to optionally offset the SYSREF alignment event by ±1 device clock cycles. Field SYSR_STATUS_ENA enables the SYSREF capture alignment accumulation and will generate alarms when enabled. Writing a “1” to field SYSR_ALIGN_SYNC clears the accumulated SYSREF alignment statistics. The SYSREF alignment block can be bypassed completely by field SYSREF_BYPASS_ALIGN, in which case SYSREF is latched by the rising edge of DACCLK. When field SYSR_STATUS_ENA is high the device records the phase associated with each SYSREF event for use in characterizing the SYSREF capture timing and selecting an appropriate phase tolerance window. The phase data is available in two forms. First, each of the four phases has a corresponding “sticky” alarm flag indicating which phases have been observed since the last time the register was cleared. In addition, the device also accumulates statistics on the relative number of occurrences of each phase spanning multiple SYSREF events using saturating 8-bit counters. These accumulated real-time SYSREF statistics allow us to account for time-varying effects during characterization such as potential timing differences between the 1st and Nth edges in a “gapped” SYSREF pulse train. The counters are fields PHASE1_CNT and PHASE2_CNT in register SYSREF12_CNT (8.5.10), PHASE3_CNT and PHASE4_CNT in register SYSREF34_CNT (8.5.11), and ALIGN_TO_R1_CNT and ALIGN_TO_R3_CNT in register SYSREF_ALIGN_R (8.5.9). The accumulated SYSREF statistics can be cleared by writing ‘1’ to SYSR_ALIGN_SYNC. This sync signal affects only the SYSREF statistics monitors and does not cause a sync of any other portions of the design. Before collecting phase statistics, the user must first enable the SYSREF status monitoring logic by setting the SYSR_STATUS_ENA bit. The user must then generate a repeating SYSREF input before using SYSR_ALIGN_SYNC to clear the statistic counters. This is necessary to flush invalid data out of the status pipeline. The “sticky” alarm flags indicating which of the four phases have been observed since the last SYSR_ALIGN_SYNC write of ‘1’ are fields ALM_SYSRPHASE1 to ALM_SYSRPHASE4 and are contained in the ALM_SYSREF_DET register (8.5.6). 8.3.11 JESD204B Subclass 0 support Some functionality has been implemented to support Subclass 0 operation. Note that programming the SUBCLASSV configuration parameter has no functional impact on the logic. The value programmed for SUBCLASSV is only used in the initial lane alignment (ILA) sequence. The following configuration parameters are used to support Subclass 0 operation: • Field SYSREF_MODE in register JESD_SYSR_MODE (8.5.56) = 0 • Field DISABLE_ERR_RPT in register JESD_ERR_OUT (8.5.53) = 1 • Field MIN_LATENCY_ENA in register JESD_MATCH (8.5.50) = 1 |
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