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LTM2987 Datasheet(PDF) 22 Page - Analog Devices

Part # LTM2987
Description  2-Channel 짹60V Power System Manager
PDF  114 Pages
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Manufacturer  AD [Analog Devices]
Direct Link  http://www.analog.com
Logo AD - Analog Devices

LTM2987 Datasheet(HTML) 22 Page - Analog Devices

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LTC2971
22
Rev. 0
For more information www.analog.com
OPERATION
• Prevent a DC/DC converter from re-entering the ON
state after a power cycle until a programmable interval
(MFR_RESTART_DELAY) has elapsed and its output
has decayed below a programmable threshold voltage
(MFR_VOUT_DISCHARGE_THRESHOLD).
• Read high side input current, input voltage, input
power, and accumulated input energy.
• Record minimum and maximum input voltage, input
current, input power, output voltages, output currents
and output temperatures.
• Access user EEPROM data directly, without alter-
ing RAM space (Mfr_ee_unlock, Mfr_ee_erase, and
Mfr_ee_data).Facilitatesin-housebulkprogramming.
• Accommodate multiple hosts with Command Plus.
EEPROM
The LTC2971 contains internal EEPROM (Nonvolatile
Memory) with error-correcting-code (ECC) to store con-
figuration settings and fault log information. EEPROM
endurance, retention and mass write operation time are
specifiedovertheoperatingtemperaturerange.SeeElectri-
calCharacteristicsandAbsoluteMaximumRatingssections.
Read operations performed between −40°C and 125°C
will not degrade the EEPROM. Write operations above
85°C are possible but will degrade retention characteris-
tics. It is recommended that the EEPROM not be written
above 85°C. The fault logging function, which is useful
in debugging system problems that may occur at high
temperatures, only writes to fault log EEPROM locations.
If occasional writes to these registers occur above 85°C,
theslightdegradationintheretentioncharacteristicsofthe
fault log will not take away the usefulness of the function.
The degradation in EEPROM retention for temperatures
>125°C can be approximated by calculating the dimen-
sionless acceleration factor using the following equation.
AF
= e 
Ea
k
⎛
⎝⎜
⎞
⎠⎟
•
1
TUSE+273
–
1
TSTRESS+273
⎛
⎝⎜
⎞
⎠⎟
⎡
⎣
⎢
⎢
⎤
⎦
⎥
⎥
where:
AF = acceleration factor
Ea = activation energy = 1.4eV
k = 8.617 • 10–5 eV/°K
TUSE = 125°C specified junction temperature
TSTRESS = actual junction temperature °C
Example: Calculate the effect on retention when operating
at a junction temperature of 130°C for 10 hours.
TSTRESS = 130°C
TUSE = 125°C
AF = 1.66
Equivalent operating time at 125°C = 16.6 hours.
So the overall retention of the EEPROM was degraded
by an additional 6.6 hours as a result of operation at a
junction temperature of 130°C for 10 hours. Note that the
effect of this overstress is negligible when compared to
the overall EEPROM retention rating of 87,600 hours at
a junction temperature of 125°C.
AUXFAULTB
The MFR_CONFIG2_LTC2971 and MFR_CONFIG3_
LTC2971 commands can be used on a per channel basis
to select which, if any, fault conditions will cause the
AUXFAULTB pin to be driven low. The only fault types
which can be propagated to the AUXFAULTB pin are over/
under voltage faults.
RESETB
Holding the WDI/RESETB pin low for more than tRESETB
will cause the LTC2971 to enter the power-on reset state.
While in the power-on reset state, the device will not
communicate on the I2C bus. Following the subsequent
rising-edge of the WDI/RESETB pin, the LTC2971 will
execute its power-on sequence per the user configuration
stored in EEPROM. Connect WDI/RESETB to VDD33 with
a 10k resistor. WDI/RESETB includes an internal 256µs
deglitch filter so additional filter capacitance on this pin
is not recommended.



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