LTM4677 datasheet(9/110 Pages) AD

9 / 110 page

LTC3888-1

Rev. 0

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Note 1: Absolute Maximum Ratings are given relative to GND, unless

otherwise specified. Stresses beyond those listed under Absolute

Maximum Ratings may cause permanent damage to the device. Exposure

to any Absolute Maximum Rating condition for extended periods may

affect device reliability and lifetime.

Note 2: The LTC3888-1 is tested under pulsed load conditions such that

TJ ≈ TA. Junction temperature TJ is calculated in °C from the ambient

temperature TA and power dissipation PD according to the formula: TJ =

TA + (PD • θJA) where θJA is the package thermal impedance. Note that

the maximum ambient temperature consistent with these specifications

is determined by specific operating conditions in conjunction with board

layout, the rated package thermal impedance and other environmental

factors. Refer to the Applications Information section.

Note 3: This IC includes overtemperature protection that is intended to

protect the device during momentary overload conditions. The maximum

rated junction temperature will be exceeded when this protection is active.

Continuous operation above the specified absolute maximum operating

junction temperature may impair device reliability or permanently damage

the device.

Note 4: Do not apply a voltage source to INTVCC unless shorted to VIN.

Otherwise, connect only external passive components for LTC3888-1

configuration. See Electrical Characteristics for applicable limits beyond

which permanent damage may occur.

Note 5: An external voltage source may be connected directly to VDD33

only if the device is not powered from VIN or INTVCC. Otherwise, connect

only external passive components for LTC3888-1 configuration. See

Electrical Characteristics for applicable limits beyond which permanent

damage may occur.

Note 6: Do not apply a voltage source directly to these pins. See Electrical

Characteristics for applicable limits beyond which permanent damage may

occur.

Note 7: Do not apply a voltage or current source directly to these pins.

Connect only external passive components for LTC3888-1 configuration

and application, otherwise permanent damage may occur.

Note 8: All currents into device pins are positive; all currents out of device

pins are negative. All voltages are referenced to GND unless otherwise

specified.

Note 9: Specified accuracy requires Servo Mode to be set with MFR_

PWM_MODE_LTC3888-1 command bit 6. VOUT_COMMAND must be

within ±5.5% of unadjusted VOUT.

Note 10: LTC3888-1 output voltage control is trimmed and measured in

a feedback loop that servos ITH to a specified value using a fixed external

gain of 3.5. Output accuracy may be better than that of other loop-

regulated voltages (DAOUT, VFB). Output accuracy without Servo Mode

may degrade when external gain deviates from 3.5 in the application.

Note 11: ADC tested with PWMs disabled. Comparable capability

demonstrated by in-circuit evaluations. Total unadjusted error includes all

gain and linearity errors, as well as offsets.

Note 12: Internal 32-bit calculations using 16-bit ADC results are limited to

10-bit mantissa resolution by PMBus linear 11-bit data format.

Note 13: Limits guaranteed by TSNS voltage and current measurements

during test, including ADC read backs.

Note 14: Data conversion is done in round robin fashion. If all inputs

signals are scanned, continuous in-sequence conversions result in a

typical latency of 90ms.

Note 15: The EEPROM endurance, retention and mass write times are

guaranteed by design, characterization and correlation with statistical

process controls. Minimum retention applies only for devices cycled less

than the minimum endurance specification. EEPROM read commands

(e.g. RESTORE_USER_ALL) are valid over the entire specified operating

junction temperature range.

Note 16: Guaranteed by design.

ELECTRICAL CHARACTERISTICS

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