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FXLS93421 Datasheet(PDF) 115 Page - NXP Semiconductors

Part # FXLS93421
Description  Dual channel inertial sensor
PDF  254 Pages
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Manufacturer  NXP [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo NXP - NXP Semiconductors

FXLS93421 Datasheet(HTML) 115 Page - NXP Semiconductors

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NXP Semiconductors
FXLS9xxxx
Dual channel inertial sensor
Where:
ΔSTACC
= The accuracy of the self-test deflection relative to the stored deflection as
specified in Section 10.8.
STDATA
= The value stored in the appropriate CHx_STy_z register as defined in
Section 11.2.37.
11.6.2.3 Startup digital self-test
In DSI3 mode, SPI mode or I2C mode, during device initialization (ENDINIT not set),
the user can activate a digital self-test by writing to the ST_CTRL[3:0] bits in the
CHx_CFG_U5 register. The digital self-test inputs a known signal stream into the front
end of the DSP. After a delay defined by the low-pass filter selected, the output sensor
data reaches a fixed value which can be verified by the user. The digital self-test values
are listed in Section 11.2.27.1.
11.6.2.4 Fixed pattern self-test
In DSI3 mode, SPI mode or I2C mode, during device initialization (ENDINIT not set),
the user can activate a fixed pattern self-test by writing to the ST_CTRL[3:0] bits in the
CHx_CFG_U5 register. Fixed pattern self-tests force the DSP output to a set of known
values, enabling the user to verify each bit of the sensor data. The fixed pattern self-test
values are listed in Section 11.2.27.1.
11.6.2.5 PSI5 automatic startup self-test procedure
Figure 20 shows the PSI5 self-test procedure which is run automatically at startup on
each channel if the device is a PSI5 device. The minimum gain settings are used for this
procedure: U_SNS_SHIFT = '00', U_SNS_MULT = 0x00.
FXLS9xxxx
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2021. All rights reserved.
Product data sheet
Rev. 6 — 8 February 2021
115 / 254



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