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LTC4449 Datasheet(PDF) 24 Page - Linear Technology |
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LTC4449 Datasheet(HTML) 24 Page - Linear Technology |
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24 / 108 page ![]() LTC3882-1 24 Rev A For more information www.analog.com OPERATION The PHAS_CFG pin settings are described in Table 10. This pin selects the phase relationships between the two channels and the selected clock source. Internal EEPROM with CRC and ECC The LTC3882-1 contains internal EEPROM with Error Correcting Coding (ECC) to store user configuration set- tings and fault log information. EEPROM endurance and retention for user space and fault log pages are specified in the Absolute Maximum Ratings and Electrical Charac- teristics table. TheintegrityoftheentireonboardEEPROMischeckedwith a CRC calculation each time its data is to be read, such as after a power-on reset or execution of a RESTORE_USER_ ALL command. If a CRC error occurs, the CML bit is set in the STATUS_BYTE and STATUS_WORD commands, the EEPROM CRC Error bit in the STATUS_MFR_SPECIFIC command is set, and the ALERT and RUN pins pulled low (PWM channels off). At that point the device will only respond at special address 0x7C, which is activated only after an invalid CRC has been detected. The chip will also respond at the global addresses 0x5A and 0x5B, but use of these addresses when attempting to recover from a CRC issue is not recommended. All power supply rails associated with either PWM channel of a device reporting an invalid CRC should remain disabled until the issue is resolved. LTC recommends that the EEPROM not be written when die temperature is greater than 85°C. If internal die tem- perature exceeds 130°C, all EEPROM operations except RESTORE_USER_ALL and MFR_RESET are disabled. Full EEPROM operation is not re-enabled until die temperature falls below 125°C. Refer to the Applications Information section for equations to predict retention degradation due to elevated operating temperatures. See the Applications Information section or contact the factoryfordetailsonefficientin-systemEEPROMprogram- ming, including bulk EEPROM programming, which the LTC3882-1 also supports. Fault Detection A variety of fault and warning detection, reporting and handling mechanisms are provided by the LTC3882-1. Fault or warning detection capabilities include: • Input Under/Overvoltage • Output Under/Overvoltage • Output Overcurrent (Peak and Average) • Internal and External Overtemperature and External Undertemperature • CML Fault (Communication, Memory, or Logic) • External Fault Detection via Bidirectional FAULT Pins Reporting is covered in following sections on status com- mands (registers) and ALERT pin function. Fault handling mechanisms include hardwired, low-level PWM safety responses that always occur, and higher-level program- mable event management. Both types are covered in the following sections. Input Supply Faults Input undervoltage and overvoltage limits are determined from multiplexed monitor ADC conversions. Therefore the input UV/OV response is naturally deglitched by the 90ms typical conversion cycle of the ADC. There is no hardwired low-level PWM response for any input supply fault. Hardwired PWM Response to VOUT Faults VOUT undervoltage (UV) and overvoltage (OV) faults are detected by supervisor comparators. The OV and UV fault limits can be set in three ways: • As a Percentage of VOUT if Using the Resistor Configu- ration Pins • From Stored EEPROM Values • By PMBus Command Theoutputovervoltagecomparatorguardsagainsttransient overshootsaswellaslongtermovervoltagesattheoutput. When an output OV fault is detected the top MOSFET for that channel is commanded off and the bottom MOSFET is commanded on until the overvoltage condition is cleared |
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