GC5316 datasheet(71/75 Pages) TI

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GC5316

SLWS154A − JANUARY 2004 − REVISED MARCH 2004

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7.4

Power Consumption

The maximum power consumption is a function of the operating mode of the chip. The cmd5316 estimates the typical

power supply current for the chip in a specific configuration. The AC Characteristics table provides maximum current

in a maximum configuration used in production test.

Current consumption on the pad supply is primarily due to the external loads and follows C x V x F. Internal loads

are estimated at 2 pF per pin. Data outputs have a transition density of going from a zero to a one, once per four

clocks, while clock outputs transition every cycle. The frame strobes consume negligible power due to the low

transition frequency. In general:

Ipad =

Σ DataPad/4 x C x F x V + Σ ClockPad x C x F x V

A worst case current would be all transmit and receive ports operating at 125 MHz.

Ipad = (1+(4 x 18 + 4 x 2 x 6)/4) x (C + 2pF) x Fout x Vpad = 31 x 22 pF x 125 MHz x 3.3 V = 280 mA.

A more typical application with two ports active would use roughly 150 mA.

7.5

DC Operating Conditions (−40

°C to 85°C case unless otherwise noted)

PARAMETER

VPAD = 3 V to 3.6 V

UNITS

PARAMETER

MIN

TYP

MAX

UNITS

VIL

Voltage input low (4)

0.8

VIH

Voltage input high (4)

VOL

Voltage output low (4) (IOL = 2 mA)

0.5

VOH

Voltage output high (4) (IOH = −2 mA)

2.4

VPAD

| IPU |

Pullup current (VIN = 0 V) (tdi, tms, trst_n, reset_n) (nominal 20 µA) (4)

µA

| IPD |

Pulldown current (VIN = VPAD) (all other inputs and bidirs) (nominal 20 µA) (4)

µA

Leakage (VIN = VPAD) (tdi, tms, trst_n, reset_n) (4)

| IIN |

Leakage (VIN = 0) (all other inputs and bidirs) (4)

µA

| IIN |

Leakage (VIN = 0 or VPAD) (all outputs) (4)

µA

ICCQ

Quiescent supply current, ICORE (4)

CIN

Capacitance for inputs (5)

CBI

Capacitance for bidirectionals (5)

NOTE: Voltages are measured at low speed. Output voltages are measured with the indicated current load.

NOTE: Currents are measured at nominal voltages, high temperature (100°C for production test, 85°C for QA).

(4) Each part is tested at 100°C case temperature for the given specification. Lots are sample tested at −40°C.

(5) Controlled by design and process and not directly tested.

GC5316 Datasheet(PDF) 71 Page - Texas Instruments

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