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DP8500 Datasheet(PDF) 40 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part # DP8500
Description  DP8520A/DP8521A/DP8522A microCMOS Programmable 256k/1M/4M Video RAM Controller/Drivers
PDF  70 Pages
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Manufacturer  NSC [National Semiconductor (TI)]
Direct Link  http://www.national.com
Logo NSC - National Semiconductor (TI)

DP8500 Datasheet(HTML) 40 Page - National Semiconductor (TI)

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90 Programming and Resetting (Continued)
94 PROGRAMMING BIT DEFINITIONS
Symbol
Description
ECAS0
Extend CAS Refresh Request Select
0
The CASn outputs will be negated with the RASn outputs when AREQ (or AREQB DP8522A only) is
negated The RFIP pin will function as refresh in progress During a video shift register load operation the
DT OE output will be negated by either the 4th rising clock edge after the input VSRL asserts or by the
VSRL input negating whichever occurs first when this mode is programmed
1
The CASn outputs will be negated during an access (Port A (or Port B DP8522A only)) when their
corresponding ECASn inputs are negated This feature allows the CAS outputs to be extended beyond the
RAS outputs negating Scrubbing refreshes are NOT affected During scrubbing refreshes the CAS outputs
will negate along with the RAS outputs regardless of the state of the ECAS inputs
The RFIP output will function as ReFresh ReQuest (RFRQ) when this mode is programmed The DT OE
output will be negated by the input VSRL negating when this mode is programmed
B1
Access Mode Select
0
ACCESS MODE 0
ALE pulsing high sets an internal latch On the next positive edge of CLK the access
(RAS) will start AREQ will terminate the access
1
ACCESS MODE 1
ADS asserted starts the access (RAS) immediately AREQ will terminate the access
B0
Address Latch Mode
0
ADS or ALE asserted for Port A or AREQB asserted for Port B with the appropriate GRANT latch the input
row column and bank address
1
The row column and bank latches are fall through
C9
Delay CAS during WRITE Accesses
0
CAS is treated the same for both READ and WRITE accesses
1
During WRITE accesses CAS will be asserted by the event that occurs last CAS asserted by the internal
delay line or CAS asserted on the positive edge of CLK after RAS is asserted
C8
Row Address Hold Time
0
Row Address Hold Time e 25 ns minimum
1
Row Address Hold Time e 15 ns minimum
C7
Column Address Setup Time
0
Column Address Setup Time e 10 ns minimum
1
Column Address Setup Time e 0 ns minimum
C6 C5 C4
RAS and CAS Configuration ModesError Scrubbing during Refresh
0 0 0
RAS0 – 3 and CAS0 – 3 are all selected during an access For a particular CAS to be asserted its
corresponding ECAS input must be asserted B0 and B1 are not used during an access Error scrubbing
during refresh
0 0 1
RAS and CAS pairs are selected during an access by B1 For a particular CAS to be asserted its
corresponding ECAS input must be asserted
B1 e 0 during an access selects RAS0 – 1 and CAS0–1
B1 e 1 during an access selects RAS2 – 3 and CAS2–3
B0 is not used during an Access
Error scrubbing during refresh
0 1 0
RAS and CAS singles are selected during an access by B0 – 1 For a particular CAS to be asserted its
corresponding ECAS input must be asserted
B1 e 0 B0 e 0 during an access selects RAS0 and CAS0
B1 e 0 B0 e 1 during an access selects RAS1 and CAS1
B1 e 1 B0 e 0 during an access selects RAS2 and CAS2
B1 e 1 B0 e 1 during an access selects RAS3 and CAS3
Error scrubbing during refresh
0 1 1
RAS0 – 3 and CAS0 – 3 are all selected during an access For a particular CAS to be asserted its
corresponding ECAS input must be asserted
B1 B0 are not used during an access
No error scrubbing (RAS only refreshing)
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