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TDA2EX Datasheet(PDF) 128 Page - Texas Instruments

Part # TDA2EX
Description  SoC for Advanced Driver Assistance Systems (ADAS) 17mm Package (CBD Package) Silicon Revision 2.0
PDF  391 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

TDA2EX Datasheet(HTML) 128 Page - Texas Instruments

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TDA2EG-17
SPRS969B – AUGUST 2016 – REVISED JUNE 2017
www.ti.com
Submit Documentation Feedback
Product Folder Links: TDA2EG-17
Specifications
Copyright © 2016–2017, Texas Instruments Incorporated
Table 5-7. Dual Voltage LVCMOS I2C DC Electrical Characteristics (continued)
over operating free-air temperature range (unless otherwise noted)
PARAMETER
MIN
NOM
MAX
UNIT
VOL3
Output low-level threshold open-drain at 3-mA
sink current
0.2 × VDDS
V
IOLmin
Low-level output current @VOL=0.2 × VDDS
3
mA
tOF
Output fall time from VIHmin to VILmax with a bus
capacitance CB from 10 pF to 400 pF
20+0.1 × Cb
250
ns
I2C Standard Mode – 3.3 V
VIH
Input high-level threshold
0.7 × VDDS
V
VIL
Input low-level threshold
0.3 × VDDS
V
Vhys
Hysteresis
0.05 × VDDS
V
IIN
Input current at each I/O pin with an input voltage
between 0.1 × VDDS to 0.9 × VDDS
31
80
µA
IOZ
IOZ(IPAD Current) for BIDI cell. This current is
contributed by the tristated driver leakage + input
current of the Rx + weak pullup/pulldown leakage.
PAD is swept from 0 to VDDS and the Max(I(PAD))
is measured and is reported as IOZ
31
80
µA
CIN
Input capacitance
10
pF
VOL3
Output low-level threshold open-drain at 3-mA
sink current
0.4
V
IOLmin
Low-level output current @VOL=0.4V
3
mA
IOLmin
Low-level output current @VOL=0.6V for full drive
load (400pF/400KHz)
6
mA
tOF
Output fall time from VIHmin to VILmax with a bus
capacitance CB from 5 pF to 400 pF
250
ns
I2C Fast Mode – 3.3 V
VIH
Input high-level threshold
0.7 × VDDS
V
VIL
Input low-level threshold
0.3 × VDDS
V
Vhys
Hysteresis
0.05 × VDDS
V
IIN
Input current at each I/O pin with an input voltage
between 0.1 × VDDS to 0.9 × VDDSS
31
80
µA
IOZ
IOZ(IPAD Current) for BIDI cell. This current is
contributed by the tristated driver leakage + input
current of the Rx + weak pullup/pulldown leakage.
PAD is swept from 0 to VDDS and the Max(I(PAD))
is measured and is reported as IOZ
31
80
µA
CIN
Input capacitance
10
pF
VOL3
Output low-level threshold open-drain at 3-mA
sink current
0.4
V
IOLmin
Low-level output current @VOL=0.4V
3
mA
IOLmin
Low-level output current @VOL=0.6V for full drive
load (400pF/400KHz)
6
mA
tOF
Output fall time from VIHmin to VILmax with a bus
capacitance CB from 10 pF to 200 pF (Proper
External Resistor Value should be used as per
I2C spec)
20+0.1 × Cb
250
ns
Output fall time from VIHmin to VILmax with a bus
capacitance CB from 300 pF to 400 pF (Proper
External Resistor Value should be used as per
I2C spec)
40
290
(1) VDDS in this table stands for corresponding power supply (i.e. vddshv3). For more information on the power supply name and the
corresponding ball, see Table 4-1, POWER [10] column.
(2) For more information on the I/O cell configurations, see the Control Module section of the Device TRM.



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