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TMS28F033 Datasheet(PDF) 29 Page - Texas Instruments |
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TMS28F033 Datasheet(HTML) 29 Page - Texas Instruments |
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29 / 52 page ![]() TMS28F033 4194304-BIT SYNCHRONOUS FLASH MEMORY SMJS833 – NOVEMBER 1997 29 POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251–1443 double-word/word typical write and block-erase duration (see Notes 18 and 19) BLOCK ERASE OPERATION WRITE OPERATION SIZE ERASE LPP MODE PROGRAMMING LOW-POWER PROGRAMMING MODE UNIT x32 / x16 x16 or x32 x16 or x32 x32 x16 x32 x16 x32 / x16 x16 or x32 x16 or x32 x32 2-CYCLE 3-CYCLE x32 2-CYCLE 3-CYCLE 6K / 12K TBD TBD TBD TBD TBD TBD TBD TBD s 16K / 32K TBD TBD TBD TBD TBD TBD TBD TBD s 32K / 64K TBD TBD TBD TBD TBD TBD TBD TBD s 48K / 96K TBD TBD TBD TBD TBD TBD TBD TBD s 80K / 160K TBD TBD TBD TBD TBD TBD TBD TBD s NOTES: 18. Excludes system-level overhead 19. Typical values shown are at TA = 25°C electrical characteristics over recommended ranges of supply voltage and ambient temperature, VDDE = 3.3 V (see Notes 20 through 23) PARAMETER TEST CONDITIONS MIN MAX UNIT VOL† Output low voltage VDDI/VDDE = MIN, IOL = 100 mA 0.2 V VOH† Output high voltage VDDI/VDDE = MIN, IOH = –100 mA VDDE–0.2 V IDDI_pwdn IDDI power-down current VDDI/VDDE = MAX, RP= VIL TBD mA ILI Input leakage VIN = GND to VDDE MAX, VDDI = VDDI MAX ± 5 mA ILO Output leakage V0 = GND to VDDE MAX, DIS = VIL , VDDI = VDDI MAX ± 10 mA IPU Internal pullup current (DIS, RP, LRV pins) (VDDI/VDDE = MIN, VPIN = 2.0 V) or (VDDI/VDDE = MAX, VPIN = 0 V) 20 600 mA IDDI Supply current, internal VDDI/VDDE = MAX, OE = VIL, at 25 MHz 100 mA IDDE Supply current, external VDDI/VDDE = MAX, OE = VIL, at 25 MHz, MOD4, x32 65 mA IPPS Supply current, for slow programming (low-power programming mode) VDDI/VPP/VDDE = MAX 50 mA IERSS Supply current, for slow erasing (low-power programming mode) VDDI/VPP/VDDE = MAX 50 mA IPPF Supply current, for fast programming VDDI/VPP/VDDE = MAX 120 mA IERSF Supply current, for fast erasing VDDI/VPP/VDDE = MAX 120 mA † Dependent on JEDEC standard 8–1A. NOTES: 20. Test results of erasing and programming with VPPL < VPP < VPPH are undefined. 21. Positive current flow is into the device. 22. Test supply voltage range: (4.5-V dc ≤ VDDI ≤ 5.5-V dc) and (3-V dc ≤ VDDE ≤ 3.6-V dc). 23. Device in read mode with OE enabled. |
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