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FXLS93421 Datasheet(PDF) 171 Page - NXP Semiconductors |
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FXLS93421 Datasheet(HTML) 171 Page - NXP Semiconductors |
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171 / 254 page ![]() NXP Semiconductors FXLS9xxxx Dual channel inertial sensor Condition exception PDCM enabled? Description Device response VBUF Error N/A VBUF < VBUF_UV_F • Response Current Deactivated • VBUFUV_ERR set, PDCM Status set as specified in Section 12.4.2.2 • The device ignores commands in CRM Internal Regulator Error N/A Internal regulator under- voltage condition • The device is held in Reset • No response to DSI commands • If activated, BUSSW_L is deactivated • The device must be reinitialized when the internal regulator returns above the threshold OTP Error Detection Fault (Factory Array) N/A Error detected in factory programmed OTP array. • Periodic Data Collection Mode response data set to error response • F_OTP_ERR set, PDCM Status set as specified in Section 12.4.2.2 OTP Error Detection Fault (User Array) N/A Error detected in User programmed OTP array and the LOCK_U bit is set. • Periodic Data Collection Mode response data set to error response • U_OTP_ERR set, PDCM Status set as specified in Section 12.4.2.2 No N/A N/A User R/W Array Error Detection Fault Yes Error detected in user read write registers and the ENDINIT bit is set. • Periodic Data Collection Mode response data set to error response • U_RW_ERR set, PDCM Status set as specified in Section 12.4.2.2 No ST activated during initialization • Internal self-test circuitry enabled • Self-test Activation Incomplete status cleared • Sensor Data Registers (SNSDATAx_x) contain self-test active data • ST_ACTIVE set Self-test Activated Yes ST activated in Periodic Data Collection Mode • Periodic Data Collection Mode sensor response data normal • Self-test Activation ignored No In initialization, before Self- test • Normal Responses to Command and Response Mode Self-test Never Activated after Reset Yes In PDCM, Self-test incomplete • Periodic Data Collection Mode sensor response data normal • ST_INCMPLT set, PDCM Status set as specified in Section 12.4.2.2 Table 257. Exception conditions and response...continued 12.7.1 Daisy chain and discovery mode error handling Table 258 shows the effect of internal failure modes on the discovery and daisy chain initialization procedures. FXLS9xxxx All information provided in this document is subject to legal disclaimers. © NXP B.V. 2021. All rights reserved. Product data sheet Rev. 6 — 8 February 2021 171 / 254 |
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