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ADXL366 Datasheet(PDF) 28 Page - Analog Devices

Part # ADXL366
Description  Micropower, 3-Axis, ±2g/±4g/±8g Digital Output MEMS Accelerometer
PDF  71 Pages
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Manufacturer  AD [Analog Devices]
Direct Link  http://www.analog.com
Logo AD - Analog Devices

ADXL366 Datasheet(HTML) 28 Page - Analog Devices

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Data Sheet
ADXL366
ADDITIONAL FEATURES
analog.com
Rev. 0 | 28 of 71
EXTERNAL CLOCK
The ADXL366 has a built-in 102.4kHz (typical) clock that, by de-
fault, serves as the time base for internal operations.
The ODR and bandwidth scale proportionally with the clock. The
ADXL366 provides a discrete number of options for the ODR, such
as 100Hz, 50Hz, and 25Hz, in factors of 2. To achieve data rates
other than those provided, an external clock can be used at the
appropriate clock frequency. The output data rate scales with the
clock frequency, as shown in Equation 5.
ODRACTUAL = ODRSELECTED ×  f102.4kHz (5)
For example, to achieve an 80Hz ODR, select the 100Hz ODR
setting and provide a clock frequency that is 80% of nominal, or
81.92kHz.
The ADXL366 can operate with external clock frequencies ranging
from the nominal 102.4kHz down to 51.2kHz to allow the user to
achieve any desired output data rate.
Alternatively, an external clock can be used to improve clock fre-
quency accuracy. To achieve tighter tolerances, a more accurate
clock can be provided externally.
Power consumption also scales with clock frequency. Higher clock
rates increase power consumption. Figure 54 shows how power
consumption varies with clock rate.
Note that the external clock must only be configured when in stand-
by mode and be running before the measurement mode command
is issued.
Figure 54. Current Consumption vs. External Clock Rate
EXTERNAL TRIGGER
For applications that require a precisely timed acceleration meas-
urement, the ADXL366 features an option to synchronize accelera-
tion sampling to an external trigger. Note that synchronized data
sampling (external trigger) is not supported in the ADXL366 when in
wake-up mode.
Refer to the Using External Trigger section for more information.
SELF TEST
The ADXL366 incorporates a self test feature that effectively tests
its mechanical and electronic systems simultaneously. When the
self test function is invoked, an electrostatic force is applied to the
mechanical sensor. This electrostatic force moves the mechanical
sensing element in the same manner as acceleration, and it is
additive to the acceleration experienced by the device. This added
electrostatic force results in an output change only on x-axis chan-
nel. Any reading made on the y-axis channel and z-axis channel
during self test is invalid.
USER REGISTER PROTECTION
The ADXL366 includes user register protection for single event up-
sets (SEUs). An SEU is a change of state caused by ions or elec-
tromagnetic radiation striking a sensitive node in a microelectronic
device. The state change is a result of the free charge created
by ionization in or close to an important node of a logic element
(for example, a memory bit). The SEU, itself, is not considered
permanently damaging to transistor or circuit functionality, but it
can create erroneous register values. The ADXL366 registers that
are protected from SEU are Register 0x00 to Register 0x43 with a
242-bit checker.
SEU protection is implemented via a 99-bit error correcting (Ham-
ming-type) code that detects both single-bit and double-bit errors.
The check bits are recomputed any time a write to any of the
protected registers occurs. At any time, if the stored version of
the check bits is not in agreement with the current check bit
calculation, the ERR_USER_REGS status bit (Bit 7) is set in the
status registers (Register 0x0B and Register 0x44).
The ERR_USER_REGS bit in the status registers is set on power-
up prior to device configuration. This bit clears on the first register
write to that device.



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