AFE8405 datasheet(39/152 Pages) TI

39 / 152 page

B0112-01

lfsr19

lfsr16

lfsr15

lfsr14

lfsr13

lfsr12

lfsr11

lfsr22

lfsr20

lfsr22

lfsr18

lfsr17

lfsr16

lfsr15

lfsr14

lfsr13

lfsr12

lfsr11

lfsr10

dout9

dout15

dout14

dout13

dout12

dout11

dout10

dout8

dout7

dout6

dout5

dout4

dout3

dout2

dout1

dout0

AFE8405

14-BIT, 85-MSPS, SINGLE-ADC, 8-CHANNEL WIDEBAND RECEIVER

www.ti.com

SLWS212 – OCTOBER 2008

The 23-bit LFSR output signal if used to create a 16-bit dout(15:0) test signal using XOR combinations of

the LFSR bits.

Figure 7-8. Mapping of LFSR Values to Output Bits

To enable the test signal generator, the slf_tst_ena control bit is set. The rxin_a/b/c/d signals are then

replaced by the four generator output streams. To use this test signal generator as a signal source for

self-test, the user must also set the adc_fifo_bypass control bit. Setting the adc_fifo_bypass control bit

causes the adcclk_a/b/c/d input clocks to be internally replaced with rxclk/N, where N is programmed with

the rate_sel(1:0) control bits to {1, 2, 4, or 8}.

The test signal generators can also output a programmable constant value. All four test signal generators

output the same programmable constant value.

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AFE8405 Datasheet(PDF) 39 Page - Texas Instruments

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