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AMD-K6 Datasheet(PDF) 132 Page - Advanced Micro Devices

Part # AMD-K6
Description  AMD-K6 Processor
PDF  346 Pages
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Manufacturer  AMD [Advanced Micro Devices]
Direct Link  http://www.amd.com
Logo AMD - Advanced Micro Devices

AMD-K6 Datasheet(HTML) 132 Page - Advanced Micro Devices

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114
Signal Descriptions
Chapter 5
AMD-K6® Processor Data Sheet
20695H/0—March 1998
Preliminary Information
5.46
TDI (Test Data Input)
Input, Internal Pullup
Summary
TDI i s t h e se ri a l test data an d i n str u cti o n i npu t fo r
boundary-scan testing using the Test Access Port (TAP). See
“Boundary-Scan Test Access Port (TAP)” on page 205 for details
regarding the operation of the TAP controller.
Sampled
The processor samples TDI on every rising TCK edge but only
while in the Shift-IR and Shift-DR states.
5.47
TDO (Test Data Output)
Output
Summary
TDO is the se rial test data and instruction out put fo r
boundary-scan testing using the Test Access Port (TAP). See
“Boundary-Scan Test Access Port (TAP)” on page 205 for details
regarding the operation of the TAP controller.
Driven and Floated
The processor drives TDO on every falling TCK edge but only
while in the Shift-IR and Shift-DR states. TDO is floated at all
other times.
5.48
TMS (Test Mode Select)
Input, Internal Pullup
Summary
TMS specifies the test function and sequence of state changes
for boundary-scan testing using the Test Access Port (TAP). See
“Boundary-Scan Test Access Port (TAP)” on page 205 for details
regarding the operation of the TAP controller.
Sampled
The processor samples TMS on every rising TCK edge. If TMS is
sampled High for five or more consecutive clocks, the TAP
controller enters its Test-Logic-Reset state, regardless of the
controller state. This action is the same as that achieved by
asserting TRST#.



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