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LMK04832PAP/EM Datasheet(PDF) 88 Page - Texas Instruments |
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LMK04832PAP/EM Datasheet(HTML) 88 Page - Texas Instruments |
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88 / 102 page  9.1.6.2 Single Event Effect One-time single event effect (SEE), including single event latch-up (SEL) and single event functional interrupt (SEFI) testing was performed according to EIA/JEDEC Standard, EIA/JEDEC57. A test report is available upon request. 9.2 Typical Application This design example highlights the available tools used to design loop filters and create a programming map. DAC Recovered “dirty” clock or clean clock Mul ple “clean” clocks at di erent and much higher frequencies CLKOUT0 & CLKOUT2 CLKOUT8 CLKOUT12, CLKOUT13 FPGA CLKIN0 VCXO Backup Reference Clock CLKIN1 OSCOUT DAC CLKOUT1 & CLKOUT3 ADC12DJ3200 QML-SP LMX2615-SP PLL+VCO Serializer/ Deserializer CLKOUT9 CLKOUT5 & CLKOUT7 CLKOUT4 & CLKOUT6 CLKOUT10 CLKOUT11 LMK04832-SEP Figure 9-6. Typical Application LMK04832-SEP SNAS838A – OCTOBER 2022 – REVISED NOVEMBER 2022 www.ti.com 88 Submit Document Feedback Copyright © 2022 Texas Instruments Incorporated Product Folder Links: LMK04832-SEP |
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