TMPR28051 datasheet(87/90 Pages) AGERE

87 / 90 page

Data Sheet

August 1999

TMPR28051 STS-1/AU-3 (STM-0) Mapper

Lucent Technologies Inc.

Typical Uses (continued)

Test Pattern Use—Complete System

The internal test pattern generator can be used in conjunction with DS1 or E1 LIU devices that have built-in loop-

backs (such as the Lucent T7698FL3/T7693) to do a complete system test, as shown in Figure 18.

5-4879(F)r.7

Figure 18. Test Pattern Usage for Complete System

Test Pattern Use—End to End

The internal test pattern generator can be used to test connectivity within a link by setting up a test pattern inser-

tion at one end and a drop at the other, as shown in Figure 19.

5-4880(F)r.7

Figure 19. Test Pattern Usage for End-to-End Operation

LIU

TEST

PATTERN

INSERT

TEST

PATTERN

DROP

LIU

TEST

PATTERN

DROP

LOOPBACK

MODE

TEST PATTERN SOURCE

LOOPBACK

MODE

OPTIONAL TEST PATTERN DROP

DS1/E1 IN

DS1/E1 AIS

DS1/E1 IN

TMPR28051

MAPPER

TMPR28051

MAPPER

TMPR28051

TEST

PATTERN

INSERT

TEST

PATTERN

DROP

TEST PATTERN SOURCE

TEST PATTERN DROP

TMPR28051

MAPPER

TMPR28051 Datasheet(PDF) 87 Page - Agere Systems

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