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TMPR28051 Datasheet(PDF) 33 Page - Agere Systems |
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TMPR28051 Datasheet(HTML) 33 Page - Agere Systems |
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33 / 90 page ![]() Data Sheet August 1999 TMPR28051 STS-1/AU-3 (STM-0) Mapper 19 Lucent Technologies Inc. Test Pattern Block Descriptions The device contains a test pattern generator and a test pattern detector for use in maintenance and trouble- shooting. Test Pattern Insert The test pattern generator is capable of transmitting four different test patterns (XMT_PAT-[1:0] in bit posi- tions 0 and 1 of register 0x08). In addition to a 215 – 1, a 220 – 1, and a 223 – 1 sequence, the device can also transmit a QRSS sequence. The QRSS pattern is a 220 – 1 pseudorandom bit sequence defined by the equation 1 + x17 + x20 = 0, with a 14 zero limit. As can be seen in Figure 1 on page 5, this test pattern can be inserted in the place of any of the transmitted or received DS1/E1 signals. The test pattern can also be provisioned to be framed (XMT_FRAME = 1 in bit 2 of register 0x08) or unframed (XMT_FRAME = 0 in bit 2 of register 0x08). The framed sequence can be either DS1 SF format (TP_DS1E1N = 1 in bit 7 of register 0x09) or E1 format (TP_DS1E1N = 0 in bit 7 of register 0x09). The test pattern can also be forced to transmit a bit error (ERROR_INS bit in register 0x08, bit position 3, is forced to make low to high transition). The test patterns are O.151 compliant, so they can be used to drive external test equipment as well as to perform internal maintenance and troubleshooting. Test Pattern Drop The test pattern detector can detect the same four test sequences generated by the test pattern generator (RCV_PAT-[1:0] in bit positions 4 and 5 of register 0x08). When the detector is out of synchronization, the device continuously monitors the input data signal for matches with the expected data signal. When the device detects 32 matches in a row, it declares itself in sync (TPOOS = 0 in bit 7 of register 0x0A), and the error detector is enabled. If the device detects eight consecutive bit mismatches, the test pattern detector declares itself out of sync (TPOOS = 1), and starts searching again. The test pattern detector can be configured to look for a framed (RCV_FRAME = 1 in bit 6 of register 0x08) or unframed (RCV_FRAME = 0 in bit 6 of register 0x08) signal. While in sync, the device counts the number of times the input data differs from the expected data in a 7-bit counter, TPERR-[6:0] (bit 0 through bit 6 in register 0x0A), that holds its count when it reaches the maxi- mum value of 128. This counter is reset when the LATCH_TP bit (bit 7) in register 0x08 makes a 0 to 1 transition. |
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