376 datasheet(22/95 Pages) INTEL

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376 EMBEDDED PROCESSOR

210 Self-Test

The 80376 has the capability to perform a self-test

The self-test checks the function of all of the Control

ROM and most of the non-random logic of the part

Approximately one-half of the 80376 can be tested

during self-test

Self-Test is initiated on the 80376 when the RESET

pin transitions from HIGH to LOW and the BUSY pin

is LOW The self-test takes about 220 clocks or ap-

proximately 33 ms with a 16 MHz 80376 processor

At the completion of self-test the processor per-

forms reset and begins normal operation The part

has successfully passed self-test if the contents of

the EAX register is zero If the EAX register is not

zero then the self-test has detected a flaw in the

part If self-test is not selected after reset EAX may

be non-zero after reset

211 Debugging Support

The 80376 provides several features which simplify

the debugging process The three categories of on-

chip debugging aids are

1 The code execution breakpoint opcode (0CCH)

2 The single-step capability provided by the TF bit

in the flag register and

3 The code and data breakpoint capability provided

by the Debug Registers DR0 – 3 DR6 and DR7

BREAKPOINT INSTRUCTION

A single-byte software interrupt (Int 3) breakpoint in-

struction is available for use by software debuggers

The breakpoint opcode is 0CCh and generates an

exception 3 trap when executed

DEBUG REGISTERS

240182 – 9

240182 – 10

240182 – 5

Figure 26 Debug Registers

376 Datasheet(PDF) 22 Page - Intel Corporation