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LMK04832PAP/EM Datasheet(PDF) 84 Page - Texas Instruments

Part # LMK04832PAP/EM
Description  LMK04832-SEP Space Grade Ultra-Low-Noise JESD204B/C Dual-Loop Clock Jitter Cleaner
PDF  103 Pages
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

LMK04832PAP/EM Datasheet(HTML) 84 Page - Texas Instruments

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9 Application and Implementation
Note
Information in the following applications sections is not part of the TI component specification,
and TI does not warrant its accuracy or completeness. TI’s customers are responsible for
determining suitability of components for their purposes, as well as validating and testing their design
implementation to confirm system functionality.
9.1 Application Information
To assist customers in frequency planning and design of loop filters, Texas Instruments provides Clock Architect
and PLLatinum Sim and on ti.com.
9.1.1 Treatment of Unused Pins
Not all pins are needed for every application. In general, power down the unused feature in software. The
unused pin may be left floating or grounded through a 1-kΩ resistor.
Table 9-1. Treatment of Unused Pins
PINS
TREATMENT IF UNUSED
CLKOUTx_P/CLKOUTx_N
1 kΩ to GND or float pin
RESET/GPO
1 kΩ to GND or float pin
SYNC/SYSREF_REQ
1 kΩ to GND or float pin
FIN0_P/FIN0_N
1 kΩ to GND or float pin
STATUS_LD1,STATUS_LD2
1 kΩ to GND or float pin
CPOUT1,CPOUT2
1 kΩ to GND or float pin
OSCOUT_P/CLKIN2_P
1 kΩ to GND or float pin
OSCOUT_N/CLKIN2_N
1 kΩ to GND or float pin
9.1.2 Digital Lock Detect Frequency Accuracy
The digital lock detect circuit is used to determine PLL1 locked, PLL2 locked, and holdover exit events. A
window size and lock count register are programmed to set a ppm frequency accuracy of reference to feedback
signals of the PLL for each event to occur. When a PLL digital lock event occurs, the digital lock detect
of the PLL is asserted true. When the holdover exit event occurs, the device will exit holdover mode when
HOLDOVER_EXIT_MODE = 1 (Exit based on DLD).
Table 9-2. Digital Lock Detect Related Fields
EVENT
PLL
WINDOW SIZE
LOCK COUNT
PLL1 Locked
PLL1
PLL1_WND_SIZE
PLL1_DLD_CNT
PLL2 Locked
PLL2
PLL2_WND_SIZE
PLL2_DLD_CNT
Holdover exit
PLL1
PLL1_WND_SIZE
HOLDOVER_DLD_CNT
For a digital lock detect event to occur, there must be a lock count number of phase detector cycles of PLLX
during which the time and phase error of the PLLX_R reference and PLLX_N feedback signal edges are within
the user programmable window size. There must be at least one lock count phase detector event before a lock
event occurs, therefore a minimum digital lock event time can be calculated as lock count / fPDX where X = 1 for
PLL1 or 2 for PLL2.
By using Equation 4, values for a lock count and window size can be chosen to set the frequency accuracy
required by the system in ppm before the digital lock detect event occurs:
1e6 × PLLX_WND_SIZE × fPDX
PLLX_DLD_CNT
ppm =
(4)
LMK04832-SEP
SNAS838 – OCTOBER 2022
www.ti.com
84
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Copyright © 2022 Texas Instruments Incorporated
Product Folder Links: LMK04832-SEP



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