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LMK04832PAP/EM Datasheet(PDF) 92 Page - Texas Instruments |
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LMK04832PAP/EM Datasheet(HTML) 92 Page - Texas Instruments |
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92 / 103 page  10 Device and Documentation Support 10.1 Device Support 10.1.1 Development Support 10.1.1.1 Clock Architect Part selection, loop filter design, simulation. To run the online Clock Architect tool, go to www.ti.com/clockarchitect. 10.1.1.2 PLLatinum Sim Supports loop filter design and simulation. All simulation is for a single loop, to perform dual loop simulations, the result of the first PLL sim must be loaded as a reference to the second PLL sim. To download PLLatinum Sim tool, go to www.ti.com/tool/PLLATINUMSIM-SW 10.1.1.3 TICS Pro EVM programming software. Can also be used to generate register map for programming and calculate current consumption estimate. For TICS Pro, go to www.ti.com/tool/TICSPRO-SW 10.2 Documentation Support 10.2.1 Related Documentation For related documentation, see the following: • AN-912 Common Data Transmission Parameters and their Definitions (SNLA036) 10.3 Receiving Notification of Documentation Updates To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on Subscribe to updates to register and receive a weekly digest of any product information that has changed. For change details, review the revision history included in any revised document. 10.4 Support Resources TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight from the experts. Search existing answers or ask your own question to get the quick design help you need. Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use. 10.5 Trademarks PLLatinum™ and TI E2E™ are trademarks of Texas Instruments. All trademarks are the property of their respective owners. 10.6 Electrostatic Discharge Caution This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. 10.7 Glossary TI Glossary This glossary lists and explains terms, acronyms, and definitions. LMK04832-SEP SNAS838 – OCTOBER 2022 www.ti.com 92 Submit Document Feedback Copyright © 2022 Texas Instruments Incorporated Product Folder Links: LMK04832-SEP |
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