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GD3160 Datasheet(PDF) 17 Page - NXP Semiconductors |
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GD3160 Datasheet(HTML) 17 Page - NXP Semiconductors |
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17 / 114 page ![]() NXP Semiconductors GD3160 Advanced IGBT/SiC gate driver VDD, VCC, VCCREG, VEE in regulation, TJ = –40 °C to +150 °C, unless otherwise specified. All voltages referenced to GND1. Currents are positive into and negative out of the specified pins. Symbol Parameter Min Typ Max Unit PWM deadtime, DEADT = '0000', 0.128 0.16 0.329 μs PWM deadtime, DEADT = '0001' 0.206 0.24 0.411 μs PWM deadtime, DEADT = '0010' 0.4 0.44 0.617 μs PWM deadtime, DEADT = '0011' 0.71 0.76 0.947 μs PWM deadtime, DEADT = '0100' 0.982 1.04 1.235 μs PWM deadtime, DEADT = '0101' 1.448 1.52 1.729 μs PWM deadtime, DEADT = '0110' 1.952 2.04 2.265 μs PWM deadtime, DEADT = '0111' 2.418 2.52 2.759 μs PWM deadtime, DEADT = '1000' 2.922 3.04 3.295 μs PWM deadtime, DEADT = '1001' 3.388 3.52 3.789 μs PWM deadtime, DEADT = '1010' 3.892 4.04 4.325 μs PWM deadtime, DEADT = '1011' 4.358 4.52 4.819 μs PWM deadtime, DEADT = '1100' 4.862 5.04 5.355 μs PWM deadtime, DEADT = '1101' 5.328 5.52 5.849 μs PWM deadtime, DEADT = '1110' 5.832 6.04 6.385 μs tMIN_DT (TIME_2 = 0) PWM deadtime, DEADT = '1111' 6.298 6.52 6.879 μs Table 11. Low-voltage digital I/O electrical characteristics...continued [1] Pins: FSSTATE, FSENB, PWM, PWMALT, SCLK, CSB, MOSI [2] CSB, PWMALT connected to VDD [3] Guaranteed by design [4] MOSI, SCLK, PWM, FSSTATE, FSENB connected to GND1; FSISO connected to GND2 [5] Pins: MISO, AOUT, INTA (when RTRPT = 1), I = 3.0 mA [6] Pins: INTB, INTA (when RTRPT = 0), I = 10 mA [7] Pins: MISO, AOUT, INTA (when RTRPT = 1), I = −2.0 mA [8] Pins: PWM, PWMALT [9] CLoad = 2 nF, guaranteed by design [10] TIME_2_is Timer scaling bit of MODE1 register VDD, VCC, VCCREG, VEE in regulation, TJ = −40 to +150 °C, unless otherwise specified. All voltages referenced to GND1. Currents are positive into and negative out of the specified pins. Limit value Symbol Parameter Min Typ Max Unit fSPI Frequency of SPI operation [1] [2] — — 10 MHz tlead Falling edge of CSB to rising edge of SCLK (required setup time) [2] 50 — — ns tlag Falling edge of SCLK to rising edge of CSB (required setup time) [2] 50 — — ns twh High time of SCLK [2] 45 — — ns twl Low time of SCLK [2] 45 — — ns tsu1 MOSI to rising edge of SCLK (required setup time) [2] 15 — — ns th MOSI to rising edge of SCLK (required hold time) [2] 15 — — ns tSO(en) Time from falling edge of CSB to MISO low impedance [2] — — 30 ns tSO(dis) Time from Rising Edge of CSB to MISO high Impedance [2] — — 30 ns tvalid Time from falling edge of SCLK to MISO data valid [3] [2] — — 30 ns Table 12. SPI timing GD3160 All information provided in this document is subject to legal disclaimers. © 2024 NXP B.V. All rights reserved. Product data sheet Rev. 13 — 6 May 2024 17 / 114 |
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