DP8496 datasheet(91/92 Pages) NSC

91 / 92 page

80 AC Test Conditions

The AC Characteristics in Section 70 are tested under the

conditions described below If a variable is included in the

Min or Max column the value of that variable should be

based on the conditions used in the current application

not the Min or Max specification from a table

The AC specifications are tested at different BCLK and

RCLK frequencies The frequencies tested are listed in Ta-

ble 81 If a variable is included in the Min or Max column

you may calculate an estimate for that characteristic for any

frequency However only the frequencies listed in Table 81

are guaranteed

TABLE 81 Guaranteed Frequencies

BCLK

15 MHz

175 MHz

20 MHz

TABLE 82 Test Conditions

Input Pulse Levels

GND to 3V

Input Rise and Fall Times

5 ns

Input and Output Reference Levels

13V

TRI-STATE Reference Levels

Active High b 05V

Active Low a 05V

TABLE 83 Capacitance

Symbol

Parameter

Typ

Units

CIN

Input Capacitance

COUT

Output Capacitance

Note 1

TA e 25 C f e 1 MHz

Note 2

These parameters are not 100% tested

TLF11212 – 9

FIGURE 81 Test Jig

Note 1

CL e 110 pF for Buffer Memory Interface pins 50 pF for all other

pins Includes jig and scope capacitance

Note 2

S1 e open for push-pull outputs S1 e VCC for high impedance to

active low and active low to high impedance measurements S1 e GND for

high impedance to active high and active high to high impedance measure-

ments RL e 10 kX (See Note 3)

Note 3

For the SCSI interface pins (SCSI Data bus and SCSI Control lines)

S1 e VCC and RL e 150X

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