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TMS320F Datasheet(PDF) 347 Page - Texas Instruments |
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TMS320F Datasheet(HTML) 347 Page - Texas Instruments |
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347 / 389 page ![]() Connections Between the Emulator and the Target System C-12 C.6.2 Using a Target-System Clock Figure C–6 shows an application with the system test clock generated in the target system. In this application, the emulator’s TCK signal is left unconnected. Figure C–6. Target-System-Generated Test Clock NC System test clock VCC Emulator header GND 12 10 8 6 4 5 GND GND GND GND GND PD TCK_RET TCK TDO TDI TMS TRST EMU1 EMU0 9 11 7 3 1 2 14 13 JTAG device TCK TDO TDI TMS TRST EMU1 EMU0 Greater than 6 inches VCC Note: When the TMS and TDI lines are buffered, pullup resistors must be used to hold the buffer inputs at a known level when the emulator cable is not connected. There are two benefits in generating the test clock in the target system: - The emulator provides only a single 10.368-MHz test clock. If you allow the target system to generate your test clock, you can set the frequency to match your system requirements. - In some cases, you may have other devices in your system that require a test clock when the emulator is not connected. The system test clock also serves this purpose. |
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