LTC2984 datasheet(6/78 Pages) AD

6 / 78 page

LTC2984

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Note 1: Stresses beyond those listed under Absolute Maximum Ratings

may cause permanent damage to the device. Exposure to any Absolute

Maximum Rating condition for extended periods may affect device

reliability and lifetime.

Note 2: All voltage values are with respect to GND.

Note 3: Full scale ADC error. Measurements do not include reference error.

Note 4: Guaranteed by design, not subject to test.

Note 5: The input referred noise includes the contribution of internal

calibration operations.

Note 6: MUX configuration delay = default 1ms.

Note 7: Global configuration set to 60Hz rejection.

Note 8: Global configuration set to 50Hz rejection.

Note 9: Global configuration default 50Hz/60Hz rejection.

Note 10: The exact value of VREF is stored in the LTC2984 and used

for all measurement calculations. Temperature coefficient is measured

by dividing the maximum change in output voltage by the specified

temperature range.

Note 11: Analog power-up. Command status register inaccessible during

this time.

Note 12: Digital initialization. Begins at the conclusion of Analog Power-

Up. Command status register is 0 × 80 at the beginning of digital

initialization and 0 × 40 at the conclusion.

Note 13: Long-term stability typically has a logarithmic characteristic

and therefore, changes after 1000 hours tend to be much smaller than

before that time. Total drift in the second thousand hours is normally less

than one third that of the first thousand hours with a continuing trend

toward reduced drift with time. Long-term stability will also be affected by

differential stresses between the IC and the board material created during

board assembly.

Note 14: Hysteresis in output voltage is created by package stress

that differs depending on whether the IC was previously at a higher or

lower temperature. Output voltage is always measured at 25°C, but

the IC is cycled to the hot or cold temperature limit before successive

measurements. Hysteresis measures the maximum output change for the

averages of three hot or cold temperature cycles. For instruments that

are stored at well controlled temperatures (within 20 or 30 degrees of

operational temperature), it is usually not a dominant error source. Typical

hysteresis is the worst-case of 25°C to cold to 25°C or 25°C to hot to

25°C, preconditioned by one thermal cycle.

Note 15: Differential Input Range is ±VREF/2.

Note 16: RTD and thermistor measurements are made ratiometrically.

As a result current source excitation variation does not affect absolute

accuracy. Choose an excitation current such that largest sensor or RSENSE

resistance value, when driven by the nominal excitation current, will drop

1V or less. The extended ADC input range will accommodate variation in

excitation current and the ratiometric calculation will negate the absolute

value of the excitation current.

Note 17: 10-year data retention guaranteed for up to 1000 program cycles.

Note 18: Do not apply voltage or current sources to these pins. They must

be connected to capacitive loads only. Otherwise, permanent damage may

occur.

Note 19: Input leakage measured with VIN = –10mV and VIN = 2.5V.

SYMBOL

PARAMETER

CONDITIONS

MIN

TYP

MAX

UNITS

Retention

Note 17

Years

Endurance

10000

Cycles

Programming Time

Complete Transfer from RAM to EEPROM

2600

Read Time

Complete Transfer EEPROM to RAM

EEPROM CHARACTERISTICS The

denotes the specifications which apply over the full operating

temperature range, otherwise specifications are at TA = 25°C.

LTC2984 Datasheet(PDF) 6 Page - Analog Devices

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