OR4 datasheet(46/152 Pages) LATTICE

46 / 152 page

Lattice Semiconductor

Data Sheet

May, 2006

ORCA Series 4 FPGAs

Special Function Blocks (continued)

The MODE signal is generated from the decode of the instruction register. When the MODE signal is high

(EXTEST), the scan data is propagated to the output buffer. When the MODE signal is low (BYPASS or SAMPLE),

functional data from the FPGA’s internal logic is propagated to the output buffer.

The boundary-scan description language (BSDL) is provided for each device in the ORCA Series of FPGAs on the

ispLEVER CD. The BSDL is generated from a device proﬁle, pinout, and other boundary-scan information.

5-2844(F).a

Figure 29. Boundary-Scan Cell

Boundary-Scan Timing

To ensure race-free operation, data changes on speciﬁc clock edges. The TMS and TDI inputs are clocked in on the

rising edge of TCK, while changes on TDO occur on the falling edge of TCK. In the execution of an EXTEST

instruction, parallel data is output from the BSR to the FPGA pads on the falling edge of TCK. The maximum fre-

quency allowed for TCK is 20 MHz.

Figure 30 shows timing waveforms for an instruction scan operation. The diagram shows the use of TMS to

sequence the TAPC through states. The test host (or BSM) changes data on the falling edge of TCK, and it is

clocked into the DUT on the rising edge.

P_OUT

HOLI

BIDIRECTIONAL DATA CELL

I/O BUFFER

DIRECTION CONTROL CELL

MODE

UPDATE/TCK

SCAN OUT

TCK

SHIFTN/CAPTURE

P_TS

P_IN

PAD_IN

PAD_TS

PAD_OUT

SCAN IN

CAPTURE CELL

INBS (TO FPGA ARRAY)

OR4 Datasheet(PDF) 46 Page - Lattice Semiconductor