Electronic Components Datasheet Search
  English  ▼

X  

OR4 Datasheet(PDF) 3 Page - Lattice Semiconductor

Part # OR4
Description  ORCASeries 4 FPGAs
PDF  152 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
Manufacturer  LATTICE [Lattice Semiconductor]
Direct Link  http://www.latticesemi.com
Logo LATTICE - Lattice Semiconductor

OR4 Datasheet(HTML) 3 Page - Lattice Semiconductor

  OR4 Datasheet HTML 1Page - Lattice Semiconductor OR4 Datasheet HTML 2Page - Lattice Semiconductor OR4 Datasheet HTML 3Page - Lattice Semiconductor OR4 Datasheet HTML 4Page - Lattice Semiconductor OR4 Datasheet HTML 5Page - Lattice Semiconductor OR4 Datasheet HTML 6Page - Lattice Semiconductor OR4 Datasheet HTML 7Page - Lattice Semiconductor OR4 Datasheet HTML 8Page - Lattice Semiconductor OR4 Datasheet HTML 9Page - Lattice Semiconductor Next Button
Zoom Inzoom in Zoom Outzoom out
 3 / 152 page
background image
Lattice Semiconductor
3
Data Sheet
May, 2006
ORCA Series 4 FPGAs
Programmable Features (continued)
New capability to (de)multiplex I/O signals:
— New double data rate on both input and output at
rates up to 350 MHz (700 MHz effective rate).
— New 2x and 4x downlink and uplink capability per
I/O (i.e., 50 MHz internal to 200 MHz I/O).
Enhanced twin-quad programmable function unit
(PFU):
— Eight 16-bit look-up tables (LUTs) per PFU.
— Nine user registers per PFU, one following each
LUT and organized to allow two nibbles to act
independently, plus one extra for arithmetic opera-
tions.
— New register control in each PFU has two inde-
pendent programmable clocks, clock enables,
local set/reset, and data selects.
— New LUT structure allows flexible combinations of
LUT4, LUT5, new LUT6, 4 to 1 MUX, new
8 to 1 MUX, and ripple mode arithmetic functions
in the same PFU.
— 32 x 4 RAM per PFU, configurable as single- or
dual-port. Create large, fast RAM/ROM blocks
(128 x 8 in only eight PFUs) using the SLIC
decoders as bank drivers.
— Soft-wired LUTs (SWL) allow fast cascading of up
to three levels of LUT logic in a single PFU
through fast internal routing which reduces routing
congestion and improves speed.
— Flexible fast access to PFU inputs from routing.
— Fast-carry logic and routing to all four adjacent
PFUs for nibble-, byte-wide, or longer arithmetic
functions, with the option to register the PFU
carry-out.
Abundant high-speed buffered and nonbuffered rout-
ing resources provide 2x average speed improve-
ments over previous architectures.
Hierarchical routing optimized for both local and glo-
bal routing with dedicated routing resources. This
results in faster routing times with predictable and
efficient performance.
SLIC provides eight 3-statable buffers, up to 10-bit
decoder, and PAL™-like and-or-invert (AOI) in each
programmable logic cell.
Improved built-in clock management with program-
mable phase-locked loops (PPLLs) provide optimum
clock modification and conditioning for phase, fre-
quency, and duty cycle from 15 MHz up to 420 MHz.
Multiplication of the input frequency up to 64x, and
division of the input frequency down to 1/64x possi-
ble.
New 200 MHz embedded quad-port RAM blocks, two
read ports, two write ports, and two sets of byte lane
enables. Each embedded RAM block can be config-
ured as:
— 1-512 x 18 (quad-port, two read/two write) with
optional built in arbitration.
— 1-256 x 36 (dual-port, one read/one write).
— 1-1K x 9 (dual-port, one read/one write).
— 2-512 x 9 (dual-port, one read/one write for each).
— 2 RAMS with arbitrary number of words whose
sum is 512 or less by 18 (dual-port, one read/one
write).
— Supports joining of RAM blocks.
— Two 16 x 8-bit content addressable memory
(CAM) support.
— FIFO 512 x 18, 256 x 36, 1K x 9 or dual 512 x 9.
— Constant multiply (8 x 16 or 16 x 8).
— Dual-variable multiply (8 x 8).
Embedded 32-bit internal system bus plus 4-bit par-
ity interconnects FPGA logic, microprocessor inter-
face (MPI), embedded RAM blocks, and embedded
standard cell blocks with 100 MHz bus performance.
Included are built-in system registers that act as the
control and status center for the device.
Built-in testability:
— Full boundary scan (IEEE
 
®1149.1 and Draft
1149.2 joint test access group (JTAG)).
— Programming and readback through boundary
scan port compliant to IEEE Draft 1532:D1.7.
— TS_ALL testability function to 3-state all I/O pins.
— New temperature sensing diode.
New cycle stealing capability allows a typical 15% to
40% internal speed improvement after final place
and route. This feature also enables compliance with
many setup/hold and clock-to-out I/O specifications
and may provide reduced ground bounce for output
buses by allowing flexible delays of switching output
buffers.



Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100  ...More


Datasheet Download

Go To PDF Page


Link URL



Does ALLDATASHEET help your business so far?  [ DONATE ] 

About Alldatasheet   |   Advertisement   |   Contact us   |   Privacy Policy   |   Link to Datasheet    |   Link Exchange   |   Manufacturer List
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com