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MT312C/CG Datasheet(PDF) 73 Page - Zarlink Semiconductor Inc |
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MT312C/CG Datasheet(HTML) 73 Page - Zarlink Semiconductor Inc |
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73 / 90 page ![]() Secondary Registers for Test and De-Bugging MT312 73 10.2.51 QPSK Test State. Register 106 (R/W) QPSK TEST ST (106) Default value 0 dec. 00 hex. QPSK TEST ST[7:0] For factory test purposes only. 10.2.52 Test Mode. Register 125 (R/W) TEST MODE (125) Default value 0 dec. 00 hex. TEST MODE[7:0]: This register is for testing purposes only. 10.3 Read only Secondary Register Map Writing to these registers will have no effect. 10.4 Secondary Registers for Test and De-Bugging Read Register 10.4.1 Test Read. Register 107 (R) TEST R (107) Default value0 dec.00 hex. TEST R[7:0]For test purposes only. NAME ADR B7 B6 B5 B4 B3 B2 B1 B0 Def hex TEST R 107 TEST R[7:0] Test Read, for test purposes only. R 00 |
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