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DA9021 Datasheet(PDF) 115 Page - Dialog Semiconductor |
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DA9021 Datasheet(HTML) 115 Page - Dialog Semiconductor |
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115 / 142 page ![]() DA9021/22 System PMIC with high efficiency USB power manager Datasheet Revision 2.5 17-Feb-2017 CFR0011-120-00 Rev 5 115 of 142 © 2017 Dialog Semiconductor 20.3 Automatic measurements scheduler The automatic measurement scheduler allows monitoring of the system voltage VDDOUT, the charging current ICH, the battery temperature TBAT and the touch screen interface XY. Additionally, the auxiliary channels ADCIN4 to ADCIN6 are able to be automatically monitored with upper and lower thresholds set by power manager registers to give an nIRQ event if a measurement is outside these levels. All measurements are handled by the scheduler system detailed below. The scheduler performs a sequence of 10 slots continually repeated according to the configured mode. If the TSI is enabled the first half slot performs either an automatic or a manual conversion. The second half slot performs TSI actions and measurements. If the TSI measurement is disabled there is no split of the slot and only the first conversion is performed. A slot requires 100 µs. The pattern of measurements over the 10 slots depends upon the charging mode. Automatic measurements of VDDOUT, ICH and TBAT are made during charging. These cease when not charging. When automatic measurements are disabled, the manual measurements are made immediately and unused automatic measurements will handle manual conversion requests. 1 2 3 4 0 Slot No Example sequence of AUTO-ADC measurements Each Slot allows 1 automatic or manual measurement and 1 TSI measurement to be made A0 - Automatic measurement of VDDOUT (mux channel 0) A1 - Automatic measurement of ICH (mux channel 1) A2 - Automatic measurement of TBAT (mux channel 2) A4 - Automatic measurement of ADCIN4 (mux channel 4) A5 - Automatic measurement of ADCIN5 (mux channel 5) A8 - Automatic measurement of Tjunc with gain 3 (mux channel 8) M indicates time slots when a Manual measurement can be made A0 A1 M A4 A2 No charging A0 M M A4 M With charging 5 6 7 M A5 M A5 M 8 9 M A8 M Figure 47: ADC sequence 20.3.1 A0: VDDOUT low voltage nIRQ measurement mode VDDOUT is measured and compared with a threshold. If the reading is below this level for three consecutive readings an error event is generated. After an nIRQ assertion, the automatic measurement of channel VDDOUT is paused for reading. The host must clear the associated event flag (the event causing value is kept inside the result register) to re-enable the supervision of VDDOUT. If no action is taken to restore the VDDOUT voltage (discharging the battery is continued) the host may consider to switch off. Optional Always On blocks (backup battery charger or supplies, that are not disabled when powering down to RESET mode) to save energy later on. The multiple reading provides a debouncing of the VDDOUT voltage before issuing a nIRQ. The assertion of nIRQ can be masked by IRQ mask. 20.3.2 A1: ICH (and ICH_BAT average) measurement mode When the battery is being charged in FAST CHARGE mode the ICH current is measured automatically every 1 or 10 ms and an average value is determined by adding the result to an 18-bit accumulator and latching the top 8 bits every 1024 samples (during high speed mode nine measurements are ignored before performing an update). This provides an average charging current value every 10.24 s, as long as the system load current is less than the maximum current provided from the external supply. When the ICH_BAT falls below the value set (and the other requirements for charging end detection is met), an IRQ will be flagged. The IRQ can be masked. |
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