USB3503 datasheet(72/82 Pages) SMSC

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USB 2.0 HSIC High-Speed Hub Controller Optimized for Portable Applications

Datasheet

SMSC USB3503A

Revision 1.1 (02-07-13)

DATASHEET

10.10

ESD Performance

The USB3503 is protected from ESD strikes. By eliminating the requirement for external ESD

protection devices, board space is conserved, and the board manufacturer is enabled to reduce cost.

The advanced ESD structures integrated into the USB3503 protect the device whether or not it is

powered up.

10.10.1

Human Body Model (HBM) Performance

HBM testing verifies the ability to withstand the ESD strikes like those that occur during handling and

manufacturing, and is done without power applied to the IC. To pass the test, the device must have

no change in operation or performance due to the event. All pins on the USB3503 provide ±5 kV HBM

protection, as shown in Table 10.10.

10.10.2

EN 61000-4-2 Performance

The EN 61000-4-2 ESD specification is an international standard that addresses system-level immunity

to ESD strikes while the end equipment is operational. In contrast, the HBM ESD tests are performed

at the device level with the device powered down.

SMSC contracts with Independent laboratories to test the USB3503 to EN 61000-4-2 in a working

system. Reports are available upon request. Please contact your SMSC representative, and request

information on 3rd party ESD test results. The reports show that systems designed with the USB3503

can safely provide the ESD performance shown in without additional board level protection.

In addition to defining the ESD tests, EN 61000-4-2 also categorizes the impact to equipment operation

when the strike occurs (ESD Result Classification). Both air discharge and contact discharge test

techniques for applying stress conditions are defined by the EN 61000-4-2 ESD document.

10.10.3

Air Discharge

To perform this test, a charged electrode is moved close to the system being tested until a spark is

generated. This test is difficult to reproduce because the discharge is influenced by such factors as

humidity, the speed of approach of the electrode, and construction of the test equipment.

10.10.4

Contact Discharge

The uncharged electrode first contacts the pin to prepare this test, and then the probe tip is energized.

This yields more repeatable results, and is the preferred test method. The independent test laboratories

contracted by SMSC provide test results for both types of discharge methods.

System

EN/IEC 61000-4-2 Air-gap

Discharge

±15

3rd party system test

LATCH-UP PERFORMANCE

All Pins

EIA/JESD 78, Class II

150

Table 10.10 ESD and Latch-up Performance (continued)

PARAMETER

CONDITIONS

MIN

TYP

MAX

UNITS

COMMENTS

USB3503 Datasheet(PDF) 72 Page - SMSC Corporation

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