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ADC14X250 Datasheet(PDF) 28 Page - Texas Instruments |
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ADC14X250 Datasheet(HTML) 28 Page - Texas Instruments |
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28 / 69 page ![]() 28 ADC14X250 SLASE49 – DECEMBER 2015 www.ti.com Product Folder Links: ADC14X250 Submit Documentation Feedback Copyright © 2015, Texas Instruments Incorporated (1) These parameters have a binary-value-minus-1 encoding applied before being mapped into the link configuration octets. For example, F = 1 is encoded as 0. 8.3.9.3 ILA Information Table 4 summarizes the information transmitted during the initial lane alignment (ILA) sequence. Mapping of these parameters into the data stream is described in the JESD204B standard. Table 4. Configuration of the JESD204B Serial-Data Receiver Paramet er Description Logical Value Encoded Value ADJCNT DAC LMFC adjustment 0 0 ADJDIR DAC LMFC adjustment direction 0 0 BID Bank ID 0 0 CF Number of control words per frame clock period per link 0 0 CS Number of control bits per sample 0 0 DID Device identification number 0 0 F Number of octets per frame (per lane)(1) 2 1 HD High-density format 0 0 JESDV JESD204 version 1 1 K Number of frames per multi-frame(1) Set by register as 9 to 32 8 to 31 L Number of lanes per link(1) 1 0 LID Lane identification number 0 0 M Number of converters per device(1) 1 1 N Converter resolution (1) 16 15 N’ Total number of bits per sample(1) 16 15 PHADJ Phase adjustment request to DAC 0 0 S Number of samples per converter per frame cycle(1) 1 0 SCR Scrambling enabled Set by register as 0 (disabled) or 1 0 or 1 SUBCLA SSV Device subclass version 1 1 RES1 Reserved field 1 0 0 RES2 Reserved field 2 0 0 FCHK Checksum 34 + (K-1) + SCR Scrambling of the output serial data is supported and conforms to the JESD204B standard. Scrambling is disabled by default, but may be enabled via the SPI. When scrambling is enabled, the ADC14X250 device supports the early synchronization option by the receiver during the ILA sequence, although the ILA sequence data is never scrambled. 8.3.10 Test Pattern Sequences The SPI may enable the following test pattern sequences. Short- and long-transport layer, RPAT, and JSPAT sequences are not supported. Table 5. Supported Test Pattern Sequences Test Pattern Description Common Purpose D21.5 Alternating 1 and 0 pattern (101010...) Jitter or system debug K28.5 Continuous K28.5 symbols System debug Repeated ILA ILA repeats indefinitely System debug Ramp After ILA, a sample ramp is transmitted with programmable step. The 16-bit output word fully spans both octets that compose a sample. System debug and transport layer verification |
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