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ADC14X250 Datasheet(PDF) 47 Page - Texas Instruments

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Part # ADC14X250
Description  MSPS Single Channel ADC
PDF  69 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

ADC14X250 Datasheet(HTML) 47 Page - Texas Instruments

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CLKIN Zero Crossing Edge Rate [V/ns]
0.1
0.2
0.3
0.4 0.5 0.60.7
1
2
60
61
62
63
64
65
66
67
68
69
70
71
72
10 MHz
70 MHz
170 MHz
240 MHz
300 MHz
54
56
58
60
62
64
66
68
70
72
74
1
10
100
1000
Frequency [MHz]
2ps
1ps
500fs
200fs
100fs
50fs
C001
47
ADC14X250
www.ti.com
SLASE49 – DECEMBER 2015
Product Folder Links: ADC14X250
Submit Documentation Feedback
Copyright © 2015, Texas Instruments Incorporated
9.1.2.2 Clock Noise and Edge Rate
Noise added to the sampling clock path of the ADC degrades the SNR performance of the system. This noise
may include broadband noise added by the ADC clock receiver inside the ADC device but may also include
broadband and in-close phase noise added by the clock generator and any other devices leading to the CLKIN
input. The theoretical SNR performance limit of the ADC14X250 device as a result of clock noise for a given
input frequency is shown in Figure 48 for a full scale input signal and different values of total jitter.
Figure 48. SNR Limit Due to Jitter of Sampling Clock With a Full-Scale Input Signal
The differential clock receiver of the ADC14X250 device has a very-low noise floor and wide bandwidth. The
wide band clock noise of the receiver, also referred to as the additive jitter, modulates the sampling instant and
adds the noise to the signal. At the sampling instant, the added broadband noise appears in the first Nyquist
zone at the ADC output to degrade the noise performance. Minimizing the additive jitter requires a sampling
clock with a steep edge rate at the zero crossing. Reduced edge rate increases the additive jitter. For clock
signals with a differential swing of 100 mV or greater, the additive clock Figure 49 shows the SNR performance
of the ADC14X250 device for a range of clock transition slopes.
Figure 49. SNR vs Input Clock Edge Rate (–3 dBFS Input)
Noise added to the sampling clock by devices leading up to the ADC clock input also directly affects the noise
performance of the system. In-close phase noise is typically dominated by the performance of the clock
reference and phase-locked loop (PLL) that generates the clock and limits the sensitivity of the sampling system
at desired frequencies offset 100 Hz to 10 MHz away from a large blocking signal. Little can be done to improve
the in-close phase noise performance without the use of an additional PLL. Broadband noise added in the clock
path limits the sensitivity of the whole spectrum and may be improved by using lower noise devices or by
inserting a band-pass filter (BPF) with a narrow pass band and low insertion loss to the clock input signal path.
Adding a BPF limits the transition rate of the clock, thereby creating a trade-off between the additive jitter added
by the ADC clock receiver and the broadband noise added by the devices that drive the clock input.
Additional noise may couple to the clock path through power supplies. Take care to provide a very-low noise
power supply and isolated supply return path to minimize noise added to the supply. Spurious noise added to the
clock path results in symmetrical, modulated spurs around large input signals. These spurs have a constant
magnitude in units of dB relative to the input signal amplitude or carrier, [dBc].



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