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LTC6952 Datasheet(PDF) 68 Page - Analog Devices |
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LTC6952 Datasheet(HTML) 68 Page - Analog Devices |
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68 / 80 page ![]() LTC6952 68 6952f For more information www.analog.com Preliminary Technical Data Advance Product Information Subject to Change Rev PrA APPLICATIONS INFORMATION Degradation of the SNR due to sample clock jitter only occurs if the analog input signal is slewing. If the analog input signal is stationary (DC) then it does not matter when in time the sampling occurs. Additionally, a faster slewing input signal yields a greater error (more noise) than a slower slewing input signal. Figure 43 demonstrates this effect. Note how much larger the error term is with the fast slewing signal than with the slow slewing signal. To maintain the data converter’s SNR performance, digitization of high input frequency signals requires a clock with much less jitter than applications with lower frequency input signals. 6952 F43 tJ ∆V = VERROR(SLOW) ∆V = VERROR(FAST) FAST SINE WAVE SLOW SINE WAVE Figure 43. Fast and Slow Sine Wave Signals Sampled with a Jittery Clock It is important to note that the frequency of the analog input signal determines the sample clock’s jitter require- ment. The actual sample clock frequency does not matter. Many ADC applications that undersample high frequency signals have especially challenging sample clock jitter requirements. The previous discussion was useful for gaining an intuitive feel for the SNR degradation due to sampling clock jitter. Quantitatively, the actual sample clock jitter requirement for a given application is calculated as follows: tJ(TOTAL) = 10 –SNR dB 20 2 • π • fSIG (22) Where fSIG is the highest frequency signal to be digitized expressed in Hz, SNRdB is the SNR requirement in decibels and tJ(TOTAL) is the total RMS jitter in seconds. The total jitter is the RMS sum of the ADC’s aperture jitter and the sample clock jitter calculated as follows: tJ(TOTAL) = tJ(CLK) 2 +t J(ADC) 2 (23) Alternatively, for a given total jitter, the attainable SNR is calculated as follows: SNRdB= –20log10 2• π• fSIG • tJ(TOTAL) ) (24) These calculations assume a full-scale sine wave input signal. If the input signal is a complex, modulated signal with a moderate crest factor, the peak slew rate of the signal may be lower and the sample clock jitter require- ment may be relaxed. These calculations are also theoretical. They assume a noiseless ADC with infinite resolution. All realistic ADCs have both added noise and a resolution limit. The limita- tions of the ADC must be accounted for to prevent over- specifying the sampling clock. Figure 44 plots the previous equations and provides a simple, quick way to estimate the sampling clock jitter requirement for a given input signal or the expected SNR performance for a given sample clock jitter. TOTAL CLOCK JITTER (RMS) 10fs 20fs 50fs 100fs 200fs 500fs 1ps FREQUENCY OF FULL-SCALE INPUT SIGNAL (GHz) 0.01 0.1 1 10 24 34 44 54 64 74 84 94 104 114 124 6952 F44 Figure 44. SNR vs Input Signal Frequency vs Sample Clock Jitter |
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